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Simultaneous Observation of Silicon and Boron Impurity Behaviors in the Core Region of a Mid-Density LHD Plasma
http://hdl.handle.net/10655/00013034
http://hdl.handle.net/10655/000130341a511201-195f-4191-ae68-28990079408c
名前 / ファイル | ライセンス | アクション |
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pfr2021_16-1202094 (820.7 kB)
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Item type | 学術雑誌論文 / Journal Article(1) | |||||
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公開日 | 2022-02-17 | |||||
タイトル | ||||||
タイトル | Simultaneous Observation of Silicon and Boron Impurity Behaviors in the Core Region of a Mid-Density LHD Plasma | |||||
言語 | ||||||
言語 | eng | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | TESPEL | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | impurity transport | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | neoclassical transport | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | turbulent transport | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | Z-dependence | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
資源タイプ | journal article | |||||
著者 |
TAMURA, Naoki
× TAMURA, Naoki× YOSHINUMA, Mikiro× IDA, Katsumi× SUZUKI, Chihiro× GOTO, Motoshi× OISHI, Tetsutarou× SHOJI, Mamoru× MUKAI, Kiyofumi× FUNABA, Hisamichi |
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著者ID | ||||||
内容記述タイプ | Other | |||||
内容記述 | 0000-0003-1682-1519 | |||||
抄録 | ||||||
内容記述タイプ | Abstract | |||||
内容記述 | Line emissions from both silicon (Si) and boron (B) impurity ions introduced by a single tracer-encapsulated solid pellet (TESPEL) containing silicon hexaboride (SiB6) powders were successfully observed using the extreme ultraviolet (EUV) spectrometer and charge-exchange spectroscopy (CXS) technique in the Large Helical Device. The CXS diagnostic shows clearly that a hollow radial profile of fully ionized B impurities was created immediately after the TESPEL injection, and such a hollow profile was relaxed with time. At the same time, Li-like emissions from the highly ionized Si impurities were also observed with the EUV spectrometer, SOXMOS. Therefore, the decay times of these impurities could be estimated under the same plasma conditions. The estimated decay time of the Si impurities, τSi = 0.12 ± 0.01 s, was found to be slightly longer than that of the B impurities, τB = 0.09 ± 0.01 s | |||||
書誌情報 |
Plasma and Fusion Research 巻 16, p. 1202094, 発行日 2021-09-07 |
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出版者 | ||||||
出版者 | The Japan Society of Plasma Science and Nuclear Fusion Research | |||||
ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 1880-6821 | |||||
書誌レコードID | ||||||
収録物識別子タイプ | NCID | |||||
収録物識別子 | AA12346675 | |||||
DOI | ||||||
関連タイプ | isIdenticalTo | |||||
識別子タイプ | DOI | |||||
関連識別子 | 10.1585/pfr.16.1202094 | |||||
権利 | ||||||
権利情報 | (c) 2021 The Japan Society of Plasma Science and Nuclear Fusion Research | |||||
関連サイト | ||||||
識別子タイプ | DOI | |||||
関連識別子 | https://doi.org/10.1585/pfr.16.1202094 | |||||
関連名称 | Publisher version | |||||
著者版フラグ | ||||||
出版タイプ | VoR | |||||
出版タイプResource | http://purl.org/coar/version/c_970fb48d4fbd8a85 | |||||
NAIS | ||||||
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