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6 MeV heavy ion beam probe on the Large Helical Device
http://hdl.handle.net/10655/3776
http://hdl.handle.net/10655/3776b41c64dc-a855-4542-a601-c906b0facfc0
名前 / ファイル | ライセンス | アクション |
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467.pdf (249.3 kB)
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VoR_Rev.Sci.Instr77_10F523 (788.5 kB)
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Item type | 学術雑誌論文 / Journal Article_02(1) | |||||
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公開日 | 2010-03-01 | |||||
タイトル | ||||||
タイトル | 6 MeV heavy ion beam probe on the Large Helical Device | |||||
言語 | ||||||
言語 | eng | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
資源タイプ | journal article | |||||
著者 |
Ido, T.
× Ido, T.× Shimizu, A.× Nishiura, M.× Nishizawa, A.× Katoh, S.× Tsukada, K.× Yokota, M.× Ogawa, H.× Inoue, T.× Hamada, Y.× LHD, Experimental Group× Crowley, T. P. |
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抄録 | ||||||
内容記述タイプ | Abstract | |||||
内容記述 | A heavy ion beam probe (HIBP) has been installed on the Large Helical Device (LHD). A MeV-range beam is required for the LHD-HIBP. The probing beam is accelerated up to 6 MeV by use of a tandem accelerator. A new energy analyzer with tandem electrodes has also been developed to analyze such a high energy beam. As a result, a secondary beam can be detected and its energy successfully analyzed. It is verified, in principle, that the potential profile can be measured using the HIBP. | |||||
書誌情報 |
Review of Scientific Instruments 巻 Vol.77, 号 Issue10, p. pp.10F523-1~10F523-4, 発行日 2006-10-01 |
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出版者 | ||||||
出版者 | American Institute of Physics | |||||
DOI | ||||||
関連タイプ | isIdenticalTo | |||||
識別子タイプ | DOI | |||||
関連識別子 | 10.1063/1.2338311 | |||||
権利 | ||||||
権利情報 | (c) 2006 American Institute of Physics | |||||
関連サイト | ||||||
識別子タイプ | DOI | |||||
関連識別子 | https://doi.org/10.1063/1.2338311 | |||||
関連名称 | Publisher version | |||||
著者版フラグ | ||||||
出版タイプ | VoR | |||||
出版タイプResource | http://purl.org/coar/version/c_970fb48d4fbd8a85 |