{"created":"2023-06-20T15:16:32.261247+00:00","id":10275,"links":{},"metadata":{"_buckets":{"deposit":"40cc9ff0-98d8-49d2-a8bc-a9bc054b79fa"},"_deposit":{"created_by":3,"id":"10275","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"10275"},"status":"published"},"_oai":{"id":"oai:nifs-repository.repo.nii.ac.jp:00010275","sets":["8:32"]},"author_link":["64630","64629","64626","64628","64631","64627","64632","64633","64625","64624"],"item_5_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"1996-12-01","bibliographicIssueDateType":"Issued"},"bibliographic_titles":[{},{"bibliographic_title":"Research Report NIFS-Series","bibliographic_titleLang":"en"}]}]},"item_5_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"\"Accelerated electrons, which would lead to high thermal load of grids, have been suppressed in a high-current large hydrogen negative ion source. An aperture of the extraction grid is shaped as the secondary electrons generated on the grid aperture surface would be shielded against the acceleration electric field. The shaped aperture extraction grid works well to prevent the secondary electrons from leaking to the acceleration gap, compared with a straight aperture extraction grid. Although the strong magnetic field at the extraction grid also lowers the electron leakage downstream, the aperture shaping of the extraction grid is more effective for the suppression of the accelerated electrons. The acceleration efficiency, defined by the ratio of the negative ion current to the acceleration drain current, is improved to around 85 %. There remains the accelerated electrons generated in the negative ion neutralization by collision with the residual neutral molecules during the acceleration. The direct interception of the accelerated negative ions with the downstream grid is small. The reduction of the operational gas pressure is quite important to achieve the further improvement of the acceleration efficiency.\"","subitem_description_type":"Abstract"}]},"item_5_source_id_10":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0915-633X","subitem_source_identifier_type":"ISSN"}]},"item_5_text_8":{"attribute_name":"報告書番号","attribute_value_mlt":[{"subitem_text_value":"NIFS-467"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"\"Takeiri,  Y.","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Oka,  Y.","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Osakabe,  M.","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Tsumori,  K.","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Kaneko,  O.","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Takanashi,  T.","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Asano,  E.","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Kawamoto,  T.","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Akiyama,  R.","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Kuroda,  T.\"","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"negative ion source","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"negative-ion-based NBI","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"accelerated electron suppression","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"secondary electron leakage","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"grid aperture shaping","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"grid thermal load","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"acceleration efficiency","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"stripping loss","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"cesium seeding","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"long pulse operation","subitem_subject_language":"en","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"research report","resourceuri":"http://purl.org/coar/resource_type/c_18ws"}]},"item_title":"Suppression of Accelerated Electrons in a High-current Large Negative Ion Source","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Suppression of Accelerated Electrons in a High-current Large Negative Ion Source","subitem_title_language":"en"}]},"item_type_id":"5","owner":"3","path":["32"],"pubdate":{"attribute_name":"公開日","attribute_value":"2010-02-05"},"publish_date":"2010-02-05","publish_status":"0","recid":"10275","relation_version_is_last":true,"title":["Suppression of Accelerated Electrons in a High-current Large Negative Ion Source"],"weko_creator_id":"3","weko_shared_id":-1},"updated":"2023-06-20T20:51:47.135918+00:00"}