@article{oai:nifs-repository.repo.nii.ac.jp:00010547,
 author = {Hayashi, Yuki and Nishikata, H. and OHNO,  Noriyasu and KAJITA,  Shin and TANAKA,  Hirohiko and Oshima, H. and Seki, >},
 journal = {Contributions to  Plasma Physics},
 month = {Feb},
 note = {0000-0001-6090-5010, We have studied the validity of the double-probe method in recombining plasmas. Electron temperature (Te) measured with a double probe was quantitatively evaluated by taking into account the influences of plasma potential fluctuation, plasma resistivity, and electron density fluctuation on the current–voltage characteristics. Differential potential fluctuation and plasma resistivity between two electrodes have a minor effect on Te especially when the inter-distance is small (typically 1 mm). Scattering of measured Te due to the density fluctuation was sufficiently suppressed by making the data acquisition time long (typically 4 s) and taking the average. There is a good agreement between Te measured with the optimized double-probe method and that with laser Thomson scattering diagnostics.},
 title = {Double‐probe measurement in recombining plasma using NAGDIS‐II},
 year = {2019}
}