{"created":"2023-06-20T15:16:49.075711+00:00","id":10547,"links":{},"metadata":{"_buckets":{"deposit":"17c5d1aa-a959-46e9-852f-69c27fec7fa8"},"_deposit":{"created_by":19,"id":"10547","owners":[19],"pid":{"revision_id":0,"type":"depid","value":"10547"},"status":"published"},"_oai":{"id":"oai:nifs-repository.repo.nii.ac.jp:00010547","sets":["6:7"]},"author_link":["126263","126264","66732","126265","126256","66765","66768"],"item_10001_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2019-02-27","bibliographicIssueDateType":"Issued"},"bibliographic_titles":[{"bibliographic_title":"Contributions to  Plasma Physics"}]}]},"item_10001_description_4":{"attribute_name":"著者ID","attribute_value_mlt":[{"subitem_description":"0000-0001-6090-5010","subitem_description_type":"Other"}]},"item_10001_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"We have studied the validity of the double-probe method in recombining plasmas. Electron temperature (Te) measured with a double probe was quantitatively evaluated by taking into account the influences of plasma potential fluctuation, plasma resistivity, and electron density fluctuation on the current–voltage characteristics. Differential potential fluctuation and plasma resistivity between two electrodes have a minor effect on Te especially when the inter-distance is small (typically 1 mm). Scattering of measured Te due to the density fluctuation was sufficiently suppressed by making the data acquisition time long (typically 4 s) and taking the average. There is a good agreement between Te measured with the optimized double-probe method and that with laser Thomson scattering diagnostics.","subitem_description_type":"Abstract"}]},"item_10001_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"Wiley"}]},"item_10001_relation_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":" BA22397681 ","subitem_relation_type_select":"NCID"}}]},"item_10001_relation_14":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":" https://doi.org/10.1002/ctpp.201800088","subitem_relation_type_select":"DOI"}}]},"item_10001_relation_17":{"attribute_name":"関連サイト","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"Publisher version"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1002/ctpp.201800088","subitem_relation_type_select":"DOI"}}]},"item_10001_rights_15":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"his is the peer reviewed version of the following article: Contrib. Plasma Phys. 2019;59:e201800088, which has been published in final form at https://doi.org/10.1002/ctpp.201800088. This article may be used for non-commercial purposes in accordance with Wiley Terms and Conditions for Use of Self-Archived Versions."}]},"item_10001_text_23":{"attribute_name":"NAIS","attribute_value_mlt":[{"subitem_text_value":"|||"}]},"item_10001_version_type_20":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_ab4af688f83e57aa","subitem_version_type":"AM"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Hayashi, Yuki"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Nishikata, H."}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifier":""}],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"OHNO,  Noriyasu"}],"familyNames":[{}],"givenNames":[{}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifier":""}],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"KAJITA,  Shin"}],"familyNames":[{}],"givenNames":[{}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifier":""}],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"TANAKA,  Hirohiko"}],"familyNames":[{}],"givenNames":[{}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Oshima, H."}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Seki, >"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2021-06-30"}],"displaytype":"detail","filename":"Contrib.Plasma_Phys.-pp201800088.pdf","filesize":[{"value":"1.7 MB"}],"format":"application/pdf","licensetype":"license_6","mimetype":"application/pdf","url":{"label":"Contrib.Plasma_Phys.-pp201800088","url":"https://nifs-repository.repo.nii.ac.jp/record/10547/files/Contrib.Plasma_Phys.-pp201800088.pdf"},"version_id":"549187cc-109f-49c8-a665-7e803dc27cdc"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Double‐probe measurement in recombining plasma using NAGDIS‐II","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Double‐probe measurement in recombining plasma using NAGDIS‐II"}]},"item_type_id":"10001","owner":"19","path":["7"],"pubdate":{"attribute_name":"公開日","attribute_value":"2021-06-30"},"publish_date":"2021-06-30","publish_status":"0","recid":"10547","relation_version_is_last":true,"title":["Double‐probe measurement in recombining plasma using NAGDIS‐II"],"weko_creator_id":"19","weko_shared_id":19},"updated":"2023-08-01T06:57:32.605860+00:00"}