{"created":"2023-06-20T15:16:49.538510+00:00","id":10558,"links":{},"metadata":{"_buckets":{"deposit":"1914a6ad-685c-4408-b275-5373f2f00ecb"},"_deposit":{"created_by":19,"id":"10558","owners":[19],"pid":{"revision_id":0,"type":"depid","value":"10558"},"status":"published"},"_oai":{"id":"oai:nifs-repository.repo.nii.ac.jp:00010558","sets":["6:7"]},"author_link":["66289","66530","66644","126280","66934","57175","126273","66269"],"item_10001_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2015-12-30","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"12","bibliographicPageStart":"123514","bibliographicVolumeNumber":"86","bibliographic_titles":[{"bibliographic_title":"Review of Scientific Instruments"}]}]},"item_10001_description_4":{"attribute_name":"著者ID","attribute_value_mlt":[{"subitem_description":"0000-0002-0585-4561","subitem_description_type":"Other"}]},"item_10001_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"Radial profiles of density ratio of helium to hydrogen ions are measured using the charge exchange spectroscopy technique with the two-wavelength spectrometer system in the large helical device. The two-wavelength spectrometer system consists of a dichroic mirror box, a spectrometer with two grating and two camera lenses, and one CCD detector. The dichroic mirror box is used to divide the light of one fiber from the plasma to two fibers, one for HeII (λ = 468.6 nm) and the other for Hα (λ = 656.3 nm), that are connected to the entrance slit of the spectrometer to eliminate the interference between the HeII and the Hα spectra on the CCD. This system provides a simultaneous measurement of helium and hydrogen ion density ratio at 8 exact same locations (8 spatial channels) with a time resolution of >40 ms in the wide range of the density ratio of 0.05–5.","subitem_description_type":"Abstract"}]},"item_10001_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"AIP"}]},"item_10001_relation_14":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1063/1.4939032","subitem_relation_type_select":"DOI"}}]},"item_10001_relation_17":{"attribute_name":"関連サイト","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"Publisher version"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1063/1.4939032","subitem_relation_type_select":"DOI"}}]},"item_10001_rights_15":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in Review of Scientific Instruments 86, 123514 (2015) and may be found at 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