{"created":"2023-06-20T15:16:59.003584+00:00","id":10751,"links":{},"metadata":{"_buckets":{"deposit":"c7c687b2-3b1e-4c47-b187-07191d2712e6"},"_deposit":{"created_by":19,"id":"10751","owners":[19],"pid":{"revision_id":0,"type":"depid","value":"10751"},"status":"published"},"_oai":{"id":"oai:nifs-repository.repo.nii.ac.jp:00010751","sets":["6:7"]},"author_link":["126602","126603","126601","67257","126604","126373","66640","66561","126451","122626","66637"],"item_10001_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2018-04","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"3","bibliographicPageStart":"4200405","bibliographicVolumeNumber":"28","bibliographic_titles":[{"bibliographic_title":"IEEE Transactions on Applied Superconductivity"}]}]},"item_10001_description_4":{"attribute_name":"著者ID","attribute_value_mlt":[{"subitem_description":"0000-0003-1454-8117","subitem_description_type":"Other"}]},"item_10001_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"Qualification tests of the ITER toroidal field (TF) conductor joints have been carried out by testing joint samples with test facilities in the National Institute for Fusion Science, NINS, Toki, Japan. The joint sample consists of two short TF conductors with the length of 1535 mm, which is restricted by the test facility with 9-T split coils and 100-kA current leads. The sample current is supplied from a dc 75-kA power supply. Each conductor has two joint boxes at both terminals. The lower joint is a testing part that is a full-size joint of the TF coil. The joint resistance of the lower joint is estimated from the increase of the average voltage drop among the six taps on the conductor against the currents. Five joint samples were tested until 2016, and all the samples satisfied the requirement of the joint resistance at less than 3 nΩ. The method of the measurement and the results are summarized, and the voltage distribution among the voltage taps is discussed.","subitem_description_type":"Abstract"}]},"item_10001_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"IEEE"}]},"item_10001_relation_14":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"10.1109/TASC.2017.2774368","subitem_relation_type_select":"DOI"}}]},"item_10001_relation_16":{"attribute_name":"情報源","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"S. Imagawa et al., \"Test of ITER-TF Joint Samples With NIFS Test Facilities,\" in IEEE Transactions on Applied Superconductivity, vol. 28, no. 3, pp. 1-5, April 2018, Art no. 4200405, doi: 10.1109/TASC.2017.2774368."}]}]},"item_10001_relation_17":{"attribute_name":"関連サイト","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"Publisher version"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1109/TASC.2017.2774368","subitem_relation_type_select":"DOI"}}]},"item_10001_rights_15":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"© 2018 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. "}]},"item_10001_source_id_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA10791666","subitem_source_identifier_type":"NCID"}]},"item_10001_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"10518223","subitem_source_identifier_type":"ISSN"}]},"item_10001_text_23":{"attribute_name":"NAIS","attribute_value_mlt":[{"subitem_text_value":"11103"}]},"item_10001_version_type_20":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Imagawa,  Shinsaku"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"IEEE, Member"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"KAJITANI, Hideki"}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifier":""}],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"OBANA,  Tetsuhiro"}],"familyNames":[{}],"givenNames":[{}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Takada, Suguru"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Shinji, Hamaguchi"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Chikaraishi,  Hirotaka"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Takahata,  Kazuya"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Matsui, Kunihiro"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Hemmi,  Tsutomu"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Koizumi, Norikiyo"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2021-12-15"}],"displaytype":"detail","filename":"IEEE.Trans. Appl.Sup_28_4200405.pdf","filesize":[{"value":"2.7 MB"}],"format":"application/pdf","licensetype":"license_6","mimetype":"application/pdf","url":{"label":"IEEE.Trans. Appl.Sup_28_4200405","url":"https://nifs-repository.repo.nii.ac.jp/record/10751/files/IEEE.Trans. Appl.Sup_28_4200405.pdf"},"version_id":"cfe839f9-d2f9-4d85-8e56-c1bc75143b03"},{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2022-03-22"}],"displaytype":"detail","filename":"VoR_IEEE.Tran.App.Super_28_4200405.pdf","filesize":[{"value":"873.1 kB"}],"format":"application/pdf","licensetype":"license_6","mimetype":"application/pdf","url":{"label":"VoR_IEEE.Tran.App.Super_28_4200405","url":"https://nifs-repository.repo.nii.ac.jp/record/10751/files/VoR_IEEE.Tran.App.Super_28_4200405.pdf"},"version_id":"fe9144a3-71c7-4f69-83e3-65ebb0e8d435"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"Cable-in-conduit","subitem_subject_scheme":"Other"},{"subitem_subject":"current distribution","subitem_subject_scheme":"Other"},{"subitem_subject":"ITER TF coil","subitem_subject_scheme":"Other"},{"subitem_subject":"joint resistance","subitem_subject_scheme":"Other"},{"subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Test of ITER-TF Joint Samples With NIFS Test Facilities","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Test of ITER-TF Joint Samples With NIFS Test Facilities"}]},"item_type_id":"10001","owner":"19","path":["7"],"pubdate":{"attribute_name":"公開日","attribute_value":"2021-12-15"},"publish_date":"2021-12-15","publish_status":"0","recid":"10751","relation_version_is_last":true,"title":["Test of ITER-TF Joint Samples With NIFS Test Facilities"],"weko_creator_id":"19","weko_shared_id":-1},"updated":"2023-09-26T04:52:41.923006+00:00"}