{"created":"2023-06-20T15:16:59.563806+00:00","id":10760,"links":{},"metadata":{"_buckets":{"deposit":"c223a6a3-2263-4436-9cd3-9425b09c774a"},"_deposit":{"created_by":19,"id":"10760","owners":[19],"pid":{"revision_id":0,"type":"depid","value":"10760"},"status":"published"},"_oai":{"id":"oai:nifs-repository.repo.nii.ac.jp:00010760","sets":["6:7"]},"author_link":["66541","66530","66550","66572","67399","66524","66594","66776","126267","67042","126273","126311","66755","67802","66600","66548"],"item_10001_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2016-04-05","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"4","bibliographicPageStart":"043505","bibliographicVolumeNumber":"87","bibliographic_titles":[{"bibliographic_title":"Review of Scientific Instruments"}]}]},"item_10001_description_4":{"attribute_name":"著者ID","attribute_value_mlt":[{"subitem_description":"0000-0001-5669-1937","subitem_description_type":"Other"}]},"item_10001_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"This paper provides a software application of the sampling scope concept for fusion research. The time evolution of Thomson scattering data is reconstructed with a high temporal resolution during a modulated electron cyclotron resonance heating (MECH) phase. The amplitude profile and the delay time profile of the heat pulse propagation are obtained from the reconstructed signal for discharges having on-axis and off-axis MECH depositions. The results are found to be consistent with the MECH deposition.","subitem_description_type":"Abstract"}]},"item_10001_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"AIP Publishing"}]},"item_10001_relation_14":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"10.1063/1.4945258","subitem_relation_type_select":"DOI"}}]},"item_10001_relation_16":{"attribute_name":"情報源","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"Review of Scientific Instruments 87, 043505 (2016); https://doi.org/10.1063/1.4945258"}]}]},"item_10001_relation_17":{"attribute_name":"関連サイト","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"Publisher version"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1063/1.4945258","subitem_relation_type_select":"DOI"}}]},"item_10001_rights_15":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in Review of Scientific Instruments 87, 043505 (2016) and may be found at https://aip.scitation.org/doi/abs/10.1063/1.4945258."},{"subitem_rights":"Copyright 2016 Author(s). 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