{"created":"2023-06-20T15:17:05.999350+00:00","id":10880,"links":{},"metadata":{"_buckets":{"deposit":"605450e8-dd31-43b1-ac68-3b32ec48a5dc"},"_deposit":{"created_by":20,"id":"10880","owners":[20],"pid":{"revision_id":0,"type":"depid","value":"10880"},"status":"published"},"_oai":{"id":"oai:nifs-repository.repo.nii.ac.jp:00010880","sets":["6:7"]},"author_link":["66540","122586","66530","66901","67802","126857","126185","66527","66552","66551"],"item_10001_alternative_title_1":{"attribute_name":"その他（別言語等）のタイトル","attribute_value_mlt":[{"subitem_alternative_title":"The title of the accepted manuscript was \"Observation of Density Fluctuations Near the Plasma Periphery with Re ectometry in LHD\"."}]},"item_10001_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2017-07-19","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"7","bibliographicPageStart":"073509","bibliographicVolumeNumber":"88","bibliographic_titles":[{"bibliographic_title":"Review of Scientific Instruments"}]}]},"item_10001_description_4":{"attribute_name":"著者ID","attribute_value_mlt":[{"subitem_description":"0000-0002-4464-150X ","subitem_description_type":"Other"}]},"item_10001_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"A new method for measuring density fluctuation profiles near the edge of plasmas in the Large Helical Device (LHD) has been developed utilizing reflectometry combined with pellet-induced fast density scans. Reflectometer cutoff location was calculated by proportionally scaling the cutoff location calculated with fast far infrared laser interferometer (FIR) density profiles to match the slower time resolution results of the ray-tracing code LHD-GAUSS. Plasma velocity profile peaks generated with this reflectometer mapping were checked against velocity measurements made with charge exchange spectroscopy (CXS) and were found to agree within experimental uncertainty once diagnostic differences were accounted for. Measured density fluctuation profiles were found to peak strongly near the edge of the plasma, as is the case in most tokamaks. These measurements can be used in the future to inform inversion methods of phase contrast imaging (PCI) measurements. This result was confirmed with both a fixed frequency reflectometer and calibrated data from a multi-frequency comb reflectometer, and this method was applied successfully to a series of discharges. The full width at half maximum of the turbulence layer near the edge of the plasma was found to be only 1.5–3 cm on a series of LHD discharges, less than 5% of the normalized minor radius.","subitem_description_type":"Abstract"}]},"item_10001_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"AIP Publishing"}]},"item_10001_relation_14":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"10.1063/1.4993437","subitem_relation_type_select":"DOI"}}]},"item_10001_relation_16":{"attribute_name":"情報源","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"Review of Scientific Instruments 88, 073509 (2017); https://doi.org/10.1063/1.4993437"}]}]},"item_10001_relation_17":{"attribute_name":"関連サイト","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"Publisher version"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"https://aip.scitation.org/doi/abs/10.1063/1.4993437","subitem_relation_type_select":"URI"}}]},"item_10001_rights_15":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in Review of Scientific Instruments 88, 073509 (2017) and may be found at https://aip.scitation.org/doi/abs/10.1063/1.4993437."}]},"item_10001_source_id_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA00817730","subitem_source_identifier_type":"NCID"}]},"item_10001_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"00346748","subitem_source_identifier_type":"ISSN"}]},"item_10001_text_23":{"attribute_name":"NAIS","attribute_value_mlt":[{"subitem_text_value":"|||"}]},"item_10001_version_type_20":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"CREELY, Alexander J."}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifier":""}],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"IDA,  Katsumi"}],"familyNames":[{}],"givenNames":[{}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifier":""}],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"YOSHINUMA,  Mikiro"},{"creatorName":"YOSHINUMA,  Mikirou"}],"familyNames":[{},{}],"givenNames":[{},{}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifier":""}],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"TOKUZAWA,  Tokihiko"}],"familyNames":[{}],"givenNames":[{}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"TSUJIMURA, Toru"}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifier":""}],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"AKIYAMA,  Tsuyoshi"}],"familyNames":[{}],"givenNames":[{}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifier":""}],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"SAKAMOTO,  Ryuichi"}],"familyNames":[{}],"givenNames":[{}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifier":""}],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"EMOTO,  Masahiko"}],"familyNames":[{}],"givenNames":[{}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifier":""}],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"TANAKA,  Kenji"}],"familyNames":[{}],"givenNames":[{}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"MICHAEL,  Clive A."}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2021-12-24"}],"displaytype":"detail","filename":"Rev.Sci.Instr_88_pp073509.pdf","filesize":[{"value":"639.1 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"Rev.Sci.Instr_88_pp073509","url":"https://nifs-repository.repo.nii.ac.jp/record/10880/files/Rev.Sci.Instr_88_pp073509.pdf"},"version_id":"a7a81953-7b97-437b-8d7f-c6b24c253969"},{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2022-03-16"}],"displaytype":"detail","filename":"VoR_Rev.Sci.Instrum88_073509.pdf","filesize":[{"value":"5.5 MB"}],"format":"application/pdf","licensetype":"license_11","mimetype":"application/pdf","url":{"label":"VoR_Rev.Sci.Instrum88_073509","url":"https://nifs-repository.repo.nii.ac.jp/record/10880/files/VoR_Rev.Sci.Instrum88_073509.pdf"},"version_id":"8d657c61-66c5-4bd5-b7b2-25cd951b7f5f"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Novel analysis technique for measuring edge density fluctuation profiles with reflectometry in the Large Helical Device","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Novel analysis technique for measuring edge density fluctuation profiles with reflectometry in the Large Helical Device"}]},"item_type_id":"10001","owner":"20","path":["7"],"pubdate":{"attribute_name":"公開日","attribute_value":"2021-12-24"},"publish_date":"2021-12-24","publish_status":"0","recid":"10880","relation_version_is_last":true,"title":["Novel analysis technique for measuring edge density fluctuation profiles with reflectometry in the Large Helical Device"],"weko_creator_id":"20","weko_shared_id":20},"updated":"2023-09-26T03:32:47.428489+00:00"}