{"created":"2023-06-20T15:17:10.261583+00:00","id":10960,"links":{},"metadata":{"_buckets":{"deposit":"dea6740d-0351-4806-83e9-6508b99e2f8e"},"_deposit":{"created_by":21,"id":"10960","owners":[21],"pid":{"revision_id":0,"type":"depid","value":"10960"},"status":"published"},"_oai":{"id":"oai:nifs-repository.repo.nii.ac.jp:00010960","sets":["6:7"]},"author_link":["66606","66902"],"item_10001_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2008-08-12","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"4","bibliographicPageEnd":"1375","bibliographicPageStart":"1374","bibliographicVolumeNumber":"36","bibliographic_titles":[{"bibliographic_title":"IEEE Transactions on Plasma Science"}]}]},"item_10001_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"The magnetic components produced by nonaxisymmetric superconducting coils in the Large Helical Device produce a complicated magnetic structure in the plasma periphery, which strongly depend on the configuration of electric currents in the magnetic coils. A tangentially viewing charge-coupled device camera has observed line emission of doubly ionized carbon CIII. The dependence of the 3-D distribution of the CIII emission on magnetic configurations will be discussed.","subitem_description_type":"Abstract"}]},"item_10001_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"IEEE "}]},"item_10001_relation_14":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"10.1109/TPS.2008.927340","subitem_relation_type_select":"DOI"}}]},"item_10001_relation_16":{"attribute_name":"情報源","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"M. Shoji and T. Watanabe, \"Visible Images Induced by the Three-Dimensionally Complicated Structure of the Plasma Periphery in the Large Helical Device,\" in IEEE Transactions on Plasma Science, vol. 36, no. 4, pp. 1374-1375, Aug. 2008, doi: 10.1109/TPS.2008.927340."}]}]},"item_10001_relation_17":{"attribute_name":"関連サイト","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"Publisher version"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1109/TPS.2008.927340","subitem_relation_type_select":"DOI"}}]},"item_10001_rights_15":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"© 2008 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. 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