{"created":"2023-06-20T15:17:10.306174+00:00","id":10961,"links":{},"metadata":{"_buckets":{"deposit":"935434ec-323c-4d66-b063-f2e08c5cd8dc"},"_deposit":{"created_by":21,"id":"10961","owners":[21],"pid":{"revision_id":0,"type":"depid","value":"10961"},"status":"published"},"_oai":{"id":"oai:nifs-repository.repo.nii.ac.jp:00010961","sets":["6:7"]},"author_link":["66902"],"item_10001_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2011-11","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"11","bibliographicPageEnd":"2451","bibliographicPageStart":"2450","bibliographicVolumeNumber":"39","bibliographic_titles":[{"bibliographic_title":"IEEE Transactions on Plasma Science"}]}]},"item_10001_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"A tangential image of an H-alpha intensity profile in a large helical device (LHD) plasma is investigated by a neutral particle transport simulation using a detailed 3-D grid model including the geometry of the helical plasma and the vacuum vessel. The calculated image of the H-alpha intensity profile calculated by the simulation quite agrees with the observed image, which strongly suggests that there is no significant abnormal neutral particle sources in typical plasma discharge operation in LHD.","subitem_description_type":"Abstract"}]},"item_10001_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"IEEE "}]},"item_10001_relation_14":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"10.1109/TPS.2011.2160550","subitem_relation_type_select":"DOI"}}]},"item_10001_relation_16":{"attribute_name":"情報源","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"M. Shoji, \"Calculation of the Tangential View of an H-Alpha Intensity Profile in the Large Helical Device,\" in IEEE Transactions on Plasma Science, vol. 39, no. 11, pp. 2450-2451, Nov. 2011, doi: 10.1109/TPS.2011.2160550."}]}]},"item_10001_relation_17":{"attribute_name":"関連サイト","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"Publisher version"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1109/TPS.2011.2160550","subitem_relation_type_select":"DOI"}}]},"item_10001_rights_15":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"© 2011 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. 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