{"created":"2023-06-20T15:17:12.394444+00:00","id":11009,"links":{},"metadata":{"_buckets":{"deposit":"fcfd8cdc-123f-465e-a4de-514f2890918a"},"_deposit":{"created_by":21,"id":"11009","owners":[21],"pid":{"revision_id":0,"type":"depid","value":"11009"},"status":"published"},"_oai":{"id":"oai:nifs-repository.repo.nii.ac.jp:00011009","sets":["6:7"]},"author_link":["127043","127033","67178","122733","127040","127042","67184","67465","126385","123718","123965","67177","127034","122626","127041","67176"],"item_10001_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2016-01","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"41","bibliographicPageStart":"25","bibliographicVolumeNumber":"73","bibliographic_titles":[{"bibliographic_title":"Cryogenics"}]}]},"item_10001_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"In 2007, JAEA and NIFS launched the test project to evaluate the performance of cable-in-conduit (CIC) conductors and conductor joints for the JT-60SA CS and EF coils. In this project, conductor tests for four types of coil conductor and joint tests for seven types of conductor joint have been conducted for the past eight years using the NIFS test facility. As a result, the test project indicated that the CIC conductors and conductor joints fulfill the design requirement for the CS and EF coils. In addition, the NIFS test facility is expected to be utilized as the test facility for the development of a conductor and conductor joint for the purpose of the DEMO nuclear fusion power plant, provided that the required magnetic field strength is within 9 T.","subitem_description_type":"Abstract"}]},"item_10001_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"ELSEVIER "}]},"item_10001_relation_14":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"10.1016/j.cryogenics.2015.11.001","subitem_relation_type_select":"DOI"}}]},"item_10001_relation_16":{"attribute_name":"情報源","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"Tetsuhiro Obana, Kazuya Takahata, Shinji Hamaguchi, Kaname Kizu, Haruyuki Murakami, Hirotaka Chikaraishi, Hiroki Noguchi, Takashi Kobuchi, Sadatomo Moriuchi, Shinsaku Imagawa, Toshiyuki Mito, Katsuhiko Tsuchiya, Kyohei Natsume, Kiyoshi Yoshida, Kazuhiro Nomoto, Tae-hyun Kim, Conductor and joint test results of JT-60SA CS and EF coils using the NIFS test facility, Cryogenics, Volume 73, 2016, Pages 25-41, ISSN 0011-2275, https://doi.org/10.1016/j.cryogenics.2015.11.001."}]}]},"item_10001_relation_17":{"attribute_name":"関連サイト","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"Publisher version"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1016/j.cryogenics.2015.11.001","subitem_relation_type_select":"DOI"}}]},"item_10001_rights_15":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"© 2016. This manuscript version is made available under the CC-BY-NC-ND 4.0 license https://doi.org/10.1016/j.cryogenics.2022.103419 "}]},"item_10001_source_id_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA00620634 ","subitem_source_identifier_type":"NCID"}]},"item_10001_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"00112275 ","subitem_source_identifier_type":"ISSN"}]},"item_10001_text_23":{"attribute_name":"NAIS","attribute_value_mlt":[{"subitem_text_value":"|||"}]},"item_10001_version_type_20":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_ab4af688f83e57aa","subitem_version_type":"AM"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifier":""}],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"OBANA,  Tetsuhiro"}],"familyNames":[{}],"givenNames":[{}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifier":""}],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"TAKAHATA,  Kazuya"}],"familyNames":[{}],"givenNames":[{}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifier":""}],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"HAMAGUCHI,  Shinji"}],"familyNames":[{}],"givenNames":[{}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"KIZU, Kaname"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"MURAKAMI, Haruyuki"}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifier":""}],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"CHIKARAISHI,  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Kyohei"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"NOMOTO, Kazuhiro"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"KIM, Tae-hyun"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"YOSHIDA, Kiyoshi"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2022-02-03"}],"displaytype":"detail","filename":"Cryogenics73_pp25-41.pdf","filesize":[{"value":"3.6 MB"}],"format":"application/pdf","licensetype":"license_11","mimetype":"application/pdf","url":{"label":"Cryogenics73_pp25-41","url":"https://nifs-repository.repo.nii.ac.jp/record/11009/files/Cryogenics73_pp25-41.pdf"},"version_id":"1306be27-26ec-46d7-8a6d-9e9b97e672f1"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"JT-60SA","subitem_subject_scheme":"Other"},{"subitem_subject":"Cable-in-conduit (CIC) conductor","subitem_subject_scheme":"Other"},{"subitem_subject":"Current sharing temperature (Tcs) measurement","subitem_subject_scheme":"Other"},{"subitem_subject":"Joint resistance measurement","subitem_subject_scheme":"Other"},{"subitem_subject":"Test facility","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Conductor and joint test results of JT-60SA CS and EF coils using the NIFS test facility","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Conductor and joint test results of JT-60SA CS and EF coils using the NIFS test facility"}]},"item_type_id":"10001","owner":"21","path":["7"],"pubdate":{"attribute_name":"公開日","attribute_value":"2022-02-03"},"publish_date":"2022-02-03","publish_status":"0","recid":"11009","relation_version_is_last":true,"title":["Conductor and joint test results of JT-60SA CS and EF coils using the NIFS test facility"],"weko_creator_id":"21","weko_shared_id":-1},"updated":"2023-09-26T04:52:45.247412+00:00"}