{"created":"2023-06-20T15:17:15.141327+00:00","id":11070,"links":{},"metadata":{"_buckets":{"deposit":"77ec6d4d-6095-47cd-a8d5-dc2b161d6b35"},"_deposit":{"created_by":21,"id":"11070","owners":[21],"pid":{"revision_id":0,"type":"depid","value":"11070"},"status":"published"},"_oai":{"id":"oai:nifs-repository.repo.nii.ac.jp:00011070","sets":["6:7"]},"author_link":["67177","122159","127170"],"item_10001_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2021-04","bibliographicIssueDateType":"Issued"},"bibliographicPageStart":"012012","bibliographicVolumeNumber":"1857","bibliographic_titles":[{"bibliographic_title":"Journal of Physics: Conference Series"}]}]},"item_10001_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"High temperature superconducting (HTS) magnet used for a accelerator for high energy physics or a large-scale magnetic confinement system for nuclear fusion requires large current capacity HTS conductor in order to dump the stored magnetic energy quickly to protect the coil when quench has been occurred. To realize the HTS conductor, superimposed or stacked HTS tapes conductors are invented. However, local degradation of the critical current has been observed in the production of HTS conductors. Therefore, to confirm the soundness of the HTS conductor, it is necessary to establish the non-destructive detection method for the observation of degraded HTS tapes. In this study, we have investigated to inspect the degradation position in stacked HTS tapes by adopting rotating magnetization measurement method. This measurement method is measuring magnetization signal by rotating and transporting stacked HTS tapes in a static magnetic field. As a result, intentionally introduced buckling defect positions were detected by this measurement method.","subitem_description_type":"Abstract"}]},"item_10001_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":" IOP Publishing "}]},"item_10001_relation_14":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"10.1088/1742-6596/1857/1/012012 ","subitem_relation_type_select":"DOI"}}]},"item_10001_relation_16":{"attribute_name":"情報源","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":" Y Onodera et al 2021 J. Phys.: Conf. Ser. 1857 012012"}]}]},"item_10001_relation_17":{"attribute_name":"関連サイト","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"Publisher version"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"https://iopscience.iop.org/article/10.1088/1742-6596/1857/1/012012","subitem_relation_type_select":"URI"}}]},"item_10001_rights_15":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"This is the Accepted Manuscript version of an article accepted for publication in Journal of Physics: Conference Series.  IOP Publishing Ltd is not responsible for any errors or omissions in this version of the manuscript or any version derived from it.  The Version of Record is available online at https://iopscience.iop.org/article/10.1088/1742-6596/1857/1/012012."}]},"item_10001_source_id_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA12839617","subitem_source_identifier_type":"NCID"}]},"item_10001_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"17426596","subitem_source_identifier_type":"ISSN"}]},"item_10001_text_23":{"attribute_name":"NAIS","attribute_value_mlt":[{"subitem_text_value":"|||"}]},"item_10001_text_25":{"attribute_name":"書誌的事項","attribute_value_mlt":[{"subitem_text_value":"10th ACASC / 2nd Asian-ICMC / CSSJ Joint Conference 6-9 January 2020, Okinawa, Japan"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifier":""}],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"ONODERA, Yuta"}],"familyNames":[{}],"givenNames":[{}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifier":""}],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"MITO,  Toshiyuki"}],"familyNames":[{}],"givenNames":[{}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Hirano,  Naoki"}],"nameIdentifiers":[{}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Rotating magnetization method for inspection of local defect in HTS conductor","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Rotating magnetization method for inspection of local defect in HTS conductor"}]},"item_type_id":"10001","owner":"21","path":["7"],"pubdate":{"attribute_name":"公開日","attribute_value":"2022-02-15"},"publish_date":"2022-02-15","publish_status":"0","recid":"11070","relation_version_is_last":true,"title":["Rotating magnetization method for inspection of local defect in HTS conductor"],"weko_creator_id":"21","weko_shared_id":-1},"updated":"2023-09-01T00:39:51.036736+00:00"}