{"created":"2023-06-20T15:17:17.507609+00:00","id":11131,"links":{},"metadata":{"_buckets":{"deposit":"f23e5bda-0a84-496d-9525-4ab77b27dce6"},"_deposit":{"created_by":19,"id":"11131","owners":[19],"pid":{"revision_id":0,"type":"depid","value":"11131"},"status":"published"},"_oai":{"id":"oai:nifs-repository.repo.nii.ac.jp:00011131","sets":["6:7"]},"author_link":["66541","27","66533","66308","66531","66545","122093","66799","66532","67436","123952"],"item_10001_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2012-04","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"4","bibliographicPageStart":"269","bibliographicVolumeNumber":"14","bibliographic_titles":[{"bibliographic_title":"Plasma Science and Technology"}]}]},"item_10001_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"Beam-ion losses induced by fast-ion-driven toroidal Alfvén eigenmodes (TAE) were measured with a scintillator-based lost fast-ion probe (SLIP) in the large helical device (LHD). The SLIP gave simultaneously the energy E and the pitch angle χ = arccos(υ///υ) distribution of the lost fast ions. The loss fluxes were investigated for three typical magnetic configurations of Rax_vac = 3.60 m, 3.75 m, and 3.90 m, where Rax_vac is the magnetic axis position of the vacuum field. Dominant losses induced by TAEs in these three configurations were observed in the E/χ regions of 50∼190 keV/40°, 40∼170 keV/25°, and 30∼190 keV/30°, respectively. Lost-ion fluxes induced by TAEs depend clearly on the amplitude of TAE magnetic fluctuations, Rax_vac and the toroidal field strength Bt. The increment of the loss fluxes has the dependence of (bTAE/Bt)s. The power s increases from s = 1 to 3 with the increase of the magnetic axis position in finite beta plasmas.","subitem_description_type":"Abstract"}]},"item_10001_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"IOP Publishing"}]},"item_10001_relation_14":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"10.1088/1009-0630/14/4/01","subitem_relation_type_select":"DOI"}}]},"item_10001_relation_16":{"attribute_name":"情報源","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"Ogawa K. et al 2012 Plasma Sci. Technol. 14 269"}]}]},"item_10001_relation_17":{"attribute_name":"関連サイト","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"Publisher version"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1088/1009-0630/14/4/01","subitem_relation_type_select":"DOI"}}]},"item_10001_rights_15":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"This is the Accepted Manuscript version of an article accepted for publication in [NAME OF JOURNAL].  IOP Publishing Ltd is not responsible for any errors or omissions in this version of the manuscript or any version derived from it.  The Version of Record is available online at ."}]},"item_10001_source_id_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA11584951","subitem_source_identifier_type":"NCID"}]},"item_10001_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"10090630","subitem_source_identifier_type":"ISSN"}]},"item_10001_text_23":{"attribute_name":"NAIS","attribute_value_mlt":[{"subitem_text_value":"6293"}]},"item_10001_version_type_20":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_ab4af688f83e57aa","subitem_version_type":"AM"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifier":""}],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"OGAWA,  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A."}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifier":""}],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"SHIMIZU,  Akihiro"}],"familyNames":[{}],"givenNames":[{}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifier":""}],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"OSAKABE,  Masaki"}],"familyNames":[{}],"givenNames":[{}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"DARROW,  Douglass S."}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifier":""}],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"OHDACHI,  Satoshi"}],"familyNames":[{}],"givenNames":[{}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifier":""}],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"SAKAKIBARA,  Satoru"}],"familyNames":[{}],"givenNames":[{}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifier":""}],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"LHD, Experiment Group"}],"familyNames":[{}],"givenNames":[{}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2022-03-25"}],"displaytype":"detail","filename":"Plasma_Sci.Technol.14_pp269.pdf","filesize":[{"value":"363.8 kB"}],"format":"application/pdf","licensetype":"license_11","mimetype":"application/pdf","url":{"label":"Plasma_Sci.Technol.14_pp269","url":"https://nifs-repository.repo.nii.ac.jp/record/11131/files/Plasma_Sci.Technol.14_pp269.pdf"},"version_id":"7b857913-1571-4c01-8a83-c8ce1dc0a2bb"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"toroidal Alfv en eigenmode","subitem_subject_scheme":"Other"},{"subitem_subject":"fast ion loss","subitem_subject_scheme":"Other"},{"subitem_subject":"the large helical device","subitem_subject_scheme":"Other"},{"subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Magnetic Configuration Effects on Fast Ion Losses Induced by Fast Ion Driven Toroidal Alfvén Eigenmodes in the Large Helical Device","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Magnetic Configuration Effects on Fast Ion Losses Induced by Fast Ion Driven Toroidal Alfvén Eigenmodes in the Large Helical Device"}]},"item_type_id":"10001","owner":"19","path":["7"],"pubdate":{"attribute_name":"公開日","attribute_value":"2022-03-25"},"publish_date":"2022-03-25","publish_status":"0","recid":"11131","relation_version_is_last":true,"title":["Magnetic Configuration Effects on Fast Ion Losses Induced by Fast Ion Driven Toroidal Alfvén Eigenmodes in the Large Helical Device"],"weko_creator_id":"19","weko_shared_id":-1},"updated":"2024-04-15T06:46:24.783996+00:00"}