{"created":"2023-06-20T15:17:21.767220+00:00","id":11231,"links":{},"metadata":{"_buckets":{"deposit":"87405a39-110e-4cf9-ad41-4f6f8d68447d"},"_deposit":{"created_by":20,"id":"11231","owners":[20],"pid":{"revision_id":0,"type":"depid","value":"11231"},"status":"published"},"_oai":{"id":"oai:nifs-repository.repo.nii.ac.jp:00011231","sets":["6:7"]},"author_link":["66550","127469","66704","127467","127468","126495","67042","127466"],"item_10001_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2022-05-18","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"Special Issue 1","bibliographicPageStart":"2402032","bibliographicVolumeNumber":"17","bibliographic_titles":[{"bibliographic_title":"Plasma and Fusion Research "}]}]},"item_10001_description_4":{"attribute_name":"著者ID","attribute_value_mlt":[{"subitem_description":"0000-0003-2217-6018","subitem_description_type":"Other"}]},"item_10001_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"As a signal processing method for fast digitizers of the switched-capacitor-type in Thomson scattering diagnostics, a “model fitting” method is proposed. An ideal shape of the signal is estimated by this method by averaging many Thomson scattering signals. After applying this method to a relatively low density LHD plasma, the scattering of electron temperature profiles becomes small. The magnitude of error is also reduced by about 60% at some spatial channels in the core plasma. Simulations of signals with some noises based on the JT-60SA Thomson scattering system enables a showing of the expected error in electron temperature. The error can be suppressed by the “model fitting” method.","subitem_description_type":"Abstract"}]},"item_10001_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"The Japan Society of Plasma Science and Nuclear Fusion Research"}]},"item_10001_relation_14":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"10.1585/pfr.17.2402032 ","subitem_relation_type_select":"DOI"}}]},"item_10001_relation_17":{"attribute_name":"関連サイト","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"Publisher version"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1585/pfr.17.2402032 ","subitem_relation_type_select":"DOI"}}]},"item_10001_rights_15":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"(c) 2022 The Japan Society of Plasma Science and Nuclear Fusion Research"}]},"item_10001_source_id_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA12346675","subitem_source_identifier_type":"NCID"}]},"item_10001_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1880-6821","subitem_source_identifier_type":"ISSN"}]},"item_10001_text_23":{"attribute_name":"NAIS","attribute_value_mlt":[{"subitem_text_value":"13185"}]},"item_10001_text_25":{"attribute_name":"書誌的事項","attribute_value_mlt":[{"subitem_text_value":"the 30th International Toki Conference on Plasma and Fusion Research (ITC30)"}]},"item_10001_version_type_20":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifier":""}],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"FUNABA,  Hisamichi"}],"familyNames":[{}],"givenNames":[{}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"YAMADA,  Ichihiro"}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifier":""}],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"YASUHARA,  Ryo"}],"familyNames":[{}],"givenNames":[{}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifier":""}],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"UEHARA, Hiyori"}],"familyNames":[{}],"givenNames":[{}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"TOJO, Hiroshi"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"YATSUKA, Eiichi"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"LEE, Jong-ha"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"HUANG, Yuan"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2022-05-24"}],"displaytype":"detail","filename":"13185_PFR.pdf","filesize":[{"value":"289.3 kB"}],"format":"application/pdf","licensetype":"license_11","mimetype":"application/pdf","url":{"label":"13185_PFR","url":"https://nifs-repository.repo.nii.ac.jp/record/11231/files/13185_PFR.pdf"},"version_id":"a231b728-c6e2-49b1-8762-3a5f9fbc1ace"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"Thomson scattering","subitem_subject_scheme":"Other"},{"subitem_subject":"electron temperature","subitem_subject_scheme":"Other"},{"subitem_subject":"signal processing","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Fast Signal Modeling for Thomson Scattering Diagnostics and Effects on Electron Temperature Evaluation","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Fast Signal Modeling for Thomson Scattering Diagnostics and Effects on Electron Temperature Evaluation"}]},"item_type_id":"10001","owner":"20","path":["7"],"pubdate":{"attribute_name":"公開日","attribute_value":"2022-05-24"},"publish_date":"2022-05-24","publish_status":"0","recid":"11231","relation_version_is_last":true,"title":["Fast Signal Modeling for Thomson Scattering Diagnostics and Effects on Electron Temperature Evaluation"],"weko_creator_id":"20","weko_shared_id":-1},"updated":"2024-01-18T01:41:18.579330+00:00"}