{"created":"2023-06-20T15:17:26.012936+00:00","id":11327,"links":{},"metadata":{"_buckets":{"deposit":"66cd63c0-7644-4000-86a8-5af275b700d5"},"_deposit":{"created_by":20,"id":"11327","owners":[20],"pid":{"revision_id":0,"type":"depid","value":"11327"},"status":"published"},"_oai":{"id":"oai:nifs-repository.repo.nii.ac.jp:00011327","sets":["6:7"]},"author_link":["66768","66765","66732"],"item_10001_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2019-04-10","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"Special Issue 2","bibliographicPageStart":"3402049","bibliographicVolumeNumber":"14","bibliographic_titles":[{"bibliographic_title":"Plasma and Fusion Research"}]}]},"item_10001_description_4":{"attribute_name":"著者ID","attribute_value_mlt":[{"subitem_description":"0000-0002-8025-008X","subitem_description_type":"Other"}]},"item_10001_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"Helium induced nanostructures on tungsten were characterized by applying basic statistical analysis techniques to scanning electron microscope (SEM) images. As the analysis targets, pinhole- and fuzz-dominant surfaces irradiated with different ion fluences were employed. Although two-dimensional Fourier analysis of the normalized brightness of SEM images clarified several characteristic features, their differences are small to distinguish the dominant nanostructures. On the other hand, probability density functions (PDFs) of the normalized brightness indicate that hole- and fuzz-dominant surfaces have long tail and Gaussian-like shape, respectively. By using several indexes with considering the black and white saturation, it was found that kurtosis and Kullback-Leibler divergence could provide reasonable judgement as the characterization index.","subitem_description_type":"Abstract"}]},"item_10001_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"The Japan Society of Plasma Science and Nuclear Fusion Research "}]},"item_10001_relation_14":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"10.1585/pfr.14.3402049 ","subitem_relation_type_select":"DOI"}}]},"item_10001_relation_17":{"attribute_name":"関連サイト","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"Publisher version"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1585/pfr.14.3402049","subitem_relation_type_select":"DOI"}}]},"item_10001_rights_15":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"(c) 2019 The Japan Society of Plasma Science and Nuclear Fusion Research "}]},"item_10001_source_id_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA12346675","subitem_source_identifier_type":"NCID"}]},"item_10001_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1880-6821","subitem_source_identifier_type":"ISSN"}]},"item_10001_text_23":{"attribute_name":"NAIS","attribute_value_mlt":[{"subitem_text_value":"11891"}]},"item_10001_text_25":{"attribute_name":"書誌的事項","attribute_value_mlt":[{"subitem_text_value":"the 27th International Toki Conference (ITC27) & the 13th Asia Pacific Plasma Theory Conference (APPTC2018)"}]},"item_10001_version_type_20":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifier":""}],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"TANAKA,  Hirohiko"}],"familyNames":[{}],"givenNames":[{}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifier":""}],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"KAJITA,  Shin"}],"familyNames":[{}],"givenNames":[{}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifier":""}],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"OHNO,  Noriyasu"}],"familyNames":[{}],"givenNames":[{}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2022-06-22"}],"displaytype":"detail","filename":"11891_PFR.pdf","filesize":[{"value":"2.2 MB"}],"format":"application/pdf","licensetype":"license_11","mimetype":"application/pdf","url":{"label":"11891_PFR","url":"https://nifs-repository.repo.nii.ac.jp/record/11327/files/11891_PFR.pdf"},"version_id":"2d2ad42c-4faa-4e26-98c3-8ad24ae708ec"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"image analysis","subitem_subject_scheme":"Other"},{"subitem_subject":"statistical analysis","subitem_subject_scheme":"Other"},{"subitem_subject":"SEM","subitem_subject_scheme":"Other"},{"subitem_subject":"two-dimensional fast Fourier transform","subitem_subject_scheme":"Other"},{"subitem_subject":"probability density function","subitem_subject_scheme":"Other"},{"subitem_subject":"kurtosis","subitem_subject_scheme":"Other"},{"subitem_subject":"Kullback-Leibler divergence","subitem_subject_scheme":"Other"},{"subitem_subject":"pinhole","subitem_subject_scheme":"Other"},{"subitem_subject":"fuzz","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Characterization of He Induced Nanostructures Using SEM Image Analysis","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Characterization of He Induced Nanostructures Using SEM Image Analysis"}]},"item_type_id":"10001","owner":"20","path":["7"],"pubdate":{"attribute_name":"公開日","attribute_value":"2022-06-22"},"publish_date":"2022-06-22","publish_status":"0","recid":"11327","relation_version_is_last":true,"title":["Characterization of He Induced Nanostructures Using SEM Image Analysis"],"weko_creator_id":"20","weko_shared_id":-1},"updated":"2023-08-01T06:57:31.842483+00:00"}