{"created":"2023-06-20T15:17:28.833224+00:00","id":11383,"links":{},"metadata":{"_buckets":{"deposit":"a0347f62-d125-477b-bb6e-c64f0adabece"},"_deposit":{"created_by":20,"id":"11383","owners":[20],"pid":{"revision_id":0,"type":"depid","value":"11383"},"status":"published"},"_oai":{"id":"oai:nifs-repository.repo.nii.ac.jp:00011383","sets":["6:7"]},"author_link":["122251","66594","66600","66753","126930","66755","66751","66754","66750","66524","66532"],"item_10001_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2016-12-09","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"Special Issue 1","bibliographicPageStart":"2402123","bibliographicVolumeNumber":"11","bibliographic_titles":[{"bibliographic_title":"Plasma and Fusion Research "}]}]},"item_10001_description_4":{"attribute_name":"著者ID","attribute_value_mlt":[{"subitem_description":"0000-0003-3764-3184","subitem_description_type":"Other"}]},"item_10001_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"Two-dimensional potential fluctuation profiles were measured with the heavy ion beam probe (HIBP) on the Large Helical Device. For two-dimensional measurements with HIBP, the probe beam energy had to be changed, and subtle adjustment of the beam trajectory along the long beam transport line (∼20 m) was required. An automatic beam adjustment system was developed for the beam transport line, and used to easily adjust the probe beam trajectory. Potential fluctuations in the high-frequency range (∼200 kHz) were measured, and the probe beam energy was changed shot to shot. Two-dimensional potential phase structures were successfully obtained by analyzing the coherence between potential and magnetic field fluctuation, which is used as a reference signal. ","subitem_description_type":"Abstract"}]},"item_10001_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"The Japan Society of Plasma Science and Nuclear Fusion Research "}]},"item_10001_relation_14":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"10.1585/pfr.11.2402123 ","subitem_relation_type_select":"DOI"}}]},"item_10001_relation_17":{"attribute_name":"関連サイト","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"Publisher version"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1585/pfr.11.2402123","subitem_relation_type_select":"DOI"}}]},"item_10001_rights_15":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"(c) 2016 The Japan Society of Plasma Science and Nuclear Fusion Research "}]},"item_10001_source_id_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA12346775","subitem_source_identifier_type":"NCID"}]},"item_10001_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1880-6821","subitem_source_identifier_type":"ISSN"}]},"item_10001_text_23":{"attribute_name":"NAIS","attribute_value_mlt":[{"subitem_text_value":"9951"}]},"item_10001_text_25":{"attribute_name":"書誌的事項","attribute_value_mlt":[{"subitem_text_value":"the 25th International Toki Conference on Creating the Future – Innovative Science of Plasma and Fusion – "}]},"item_10001_version_type_20":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifier":""}],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"SHIMIZU,  Akihiro"}],"familyNames":[{}],"givenNames":[{}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifier":""}],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"IDO,  Takeshi"}],"familyNames":[{}],"givenNames":[{}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifier":""}],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"NISHIURA,  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Group"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2022-06-29"}],"displaytype":"detail","filename":"9951_PFR.pdf","filesize":[{"value":"5.1 MB"}],"format":"application/pdf","licensetype":"license_11","mimetype":"application/pdf","url":{"label":"9951_PFR","url":"https://nifs-repository.repo.nii.ac.jp/record/11383/files/9951_PFR.pdf"},"version_id":"a7295747-6e38-403d-b876-902e154ed48c"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"heavy ion beam probe (HIBP)","subitem_subject_scheme":"Other"},{"subitem_subject":"two-dimensional potential profile","subitem_subject_scheme":"Other"},{"subitem_subject":"helical device","subitem_subject_scheme":"Other"},{"subitem_subject":"the Large Helical Device (LHD)","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Development of 2D Potential Profile Measurements Using the Heavy Ion Beam Probe on the Large Helical Device","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Development of 2D Potential Profile Measurements Using the Heavy Ion Beam Probe on the Large Helical Device"}]},"item_type_id":"10001","owner":"20","path":["7"],"pubdate":{"attribute_name":"公開日","attribute_value":"2022-06-29"},"publish_date":"2022-06-29","publish_status":"0","recid":"11383","relation_version_is_last":true,"title":["Development of 2D Potential Profile Measurements Using the Heavy Ion Beam Probe on the Large Helical Device"],"weko_creator_id":"20","weko_shared_id":-1},"updated":"2023-09-28T02:23:11.638808+00:00"}