{"created":"2023-06-20T15:17:30.884410+00:00","id":11426,"links":{},"metadata":{"_buckets":{"deposit":"f63d3471-67af-42b8-8a1c-c8d93b2a3cae"},"_deposit":{"created_by":20,"id":"11426","owners":[20],"pid":{"revision_id":0,"type":"depid","value":"11426"},"status":"published"},"_oai":{"id":"oai:nifs-repository.repo.nii.ac.jp:00011426","sets":["6:7"]},"author_link":["67087","127006","127005"],"item_10001_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2015-07-27","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"Special Issue 2","bibliographicPageStart":"3401059","bibliographicVolumeNumber":"10","bibliographic_titles":[{"bibliographic_title":"Plasma and Fusion Research "}]}]},"item_10001_description_4":{"attribute_name":"著者ID","attribute_value_mlt":[{"subitem_description":"0000-0001-9924-9241","subitem_description_type":"Other"}]},"item_10001_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"A numerical method has been developed for analyzing the shielding current density in a high-temperature superconducting (HTS) film containing multiple cracks. By using the method, the inductive method and the scanning permanent magnet method for contactlessly measuring the critical current density has been successfully reproduced, and the identifiability of the multiple cracks in the HTS film has been investigated. The results of computations show that, when the cracks are separated from each other, the multiple cracks can be detected individually in the two types of the contactless method. On the other hand, if the crack is pretty close to the interface, the multiple cracks is considered as a single crack. However, the crack position can be detected collectively. Therefore, the contactless methods is useful method for detecting the multiple cracks in an HTS film. ","subitem_description_type":"Abstract"}]},"item_10001_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"The Japan Society of Plasma Science and Nuclear Fusion Research "}]},"item_10001_relation_14":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"10.1585/pfr.10.3401059 ","subitem_relation_type_select":"DOI"}}]},"item_10001_relation_17":{"attribute_name":"関連サイト","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"Publisher version"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1585/pfr.10.3401059","subitem_relation_type_select":"DOI"}}]},"item_10001_rights_15":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"(c) 2015 The Japan Society of Plasma Science and Nuclear Fusion Research "}]},"item_10001_source_id_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA12346675","subitem_source_identifier_type":"NCID"}]},"item_10001_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1880-6821","subitem_source_identifier_type":"ISSN"}]},"item_10001_text_23":{"attribute_name":"NAIS","attribute_value_mlt":[{"subitem_text_value":"10537"}]},"item_10001_text_25":{"attribute_name":"書誌的事項","attribute_value_mlt":[{"subitem_text_value":"the 24th International Toki Conference on Expanding Horizons of Plasma and Fusion Science through Cross-Fertilization"}]},"item_10001_version_type_20":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifier":""}],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"TAKAYAMA, Teruou"}],"familyNames":[{}],"givenNames":[{}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifier":""}],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"KAMITANI, Atsushi"}],"familyNames":[{}],"givenNames":[{}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifier":""}],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"NAKAMURA,  Hiroaki"}],"familyNames":[{}],"givenNames":[{}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2022-07-06"}],"displaytype":"detail","filename":"10537_PFR.pdf","filesize":[{"value":"878.0 kB"}],"format":"application/pdf","licensetype":"license_11","mimetype":"application/pdf","url":{"label":"10537_PFR","url":"https://nifs-repository.repo.nii.ac.jp/record/11426/files/10537_PFR.pdf"},"version_id":"27d43675-9097-4b4c-8563-c2ef609799d8"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"multiple crack","subitem_subject_scheme":"Other"},{"subitem_subject":"critical current density","subitem_subject_scheme":"Other"},{"subitem_subject":"finite element analysis","subitem_subject_scheme":"Other"},{"subitem_subject":"numerical simulation","subitem_subject_scheme":"Other"},{"subitem_subject":"high-temperature superconducting film","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Numerical Investigation on Contactless Methods for Identifying Defects in High-Temperature Superconducting Film","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Numerical Investigation on Contactless Methods for Identifying Defects in High-Temperature Superconducting Film"}]},"item_type_id":"10001","owner":"20","path":["7"],"pubdate":{"attribute_name":"公開日","attribute_value":"2022-07-06"},"publish_date":"2022-07-06","publish_status":"0","recid":"11426","relation_version_is_last":true,"title":["Numerical Investigation on Contactless Methods for Identifying Defects in High-Temperature Superconducting Film"],"weko_creator_id":"20","weko_shared_id":-1},"updated":"2023-09-29T04:24:42.535237+00:00"}