{"created":"2023-06-20T15:17:32.417982+00:00","id":11449,"links":{},"metadata":{"_buckets":{"deposit":"83fbcc28-f910-474b-a894-8f8b9e31b55e"},"_deposit":{"created_by":20,"id":"11449","owners":[20],"pid":{"revision_id":0,"type":"depid","value":"11449"},"status":"published"},"_oai":{"id":"oai:nifs-repository.repo.nii.ac.jp:00011449","sets":["6:7"]},"author_link":["67087","127092","127006","127005"],"item_10001_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2015-03-19","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"Special Issue 2","bibliographicPageStart":"3405023","bibliographicVolumeNumber":"10","bibliographic_titles":[{"bibliographic_title":"Plasma and Fusion Research"}]}]},"item_10001_description_4":{"attribute_name":"著者ID","attribute_value_mlt":[{"subitem_description":"0000-0002-4027-6576","subitem_description_type":"Other"}]},"item_10001_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"A fast and stable method is proposed for calculating the time-varying shielding current density in a high-temperature superconducting (HTS) film containing cracks. If an initial-boundary-value problem of the shielding current density is formulated by the T-method, integral forms of Faraday's law on crack surfaces are also imposed as boundary conditions. As a result of the spatial discretization of the initial-boundary-value problem, semi-explicit differential algebraic equations (DAEs) are obtained. Although the DAEs can be solved with standard ordinary-differential-equation (ODE) solvers, much CPU time is required for their numerical solution. In order to shorten the CPU time, the following high-speed algorithm is proposed: the block LU decomposition is incorporated into function evaluations in ODE solvers. A numerical code is developed on the basis of the proposed algorithm and detectability of cracks by the scanning permanent-magnet method is numerically investigated. The results of computations show that, when multiple cracks is contained in an HTS film, resolution of the scanning permanent-magnet method will be degraded remarkably. ","subitem_description_type":"Abstract"}]},"item_10001_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"The Japan Society of Plasma Science and Nuclear Fusion Research "}]},"item_10001_relation_14":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"10.1585/pfr.10.3405023","subitem_relation_type_select":"DOI"}}]},"item_10001_relation_17":{"attribute_name":"関連サイト","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"Publisher version"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":" https://doi.org/10.1585/pfr.10.3405023","subitem_relation_type_select":"DOI"}}]},"item_10001_rights_15":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"(c) 2015 The Japan Society of Plasma Science and Nuclear Fusion Research "}]},"item_10001_source_id_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA12346675","subitem_source_identifier_type":"NCID"}]},"item_10001_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1880-6821","subitem_source_identifier_type":"ISSN"}]},"item_10001_text_23":{"attribute_name":"NAIS","attribute_value_mlt":[{"subitem_text_value":"10538"}]},"item_10001_text_25":{"attribute_name":"書誌的事項","attribute_value_mlt":[{"subitem_text_value":"the 24th International Toki Conference on Expanding Horizons of Plasma and Fusion Science through Cross-Fertilization"}]},"item_10001_version_type_20":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifier":""}],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"KAMITANI, Atsushi"}],"familyNames":[{}],"givenNames":[{}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifier":""}],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"TAKAYAMA, Teruou"}],"familyNames":[{}],"givenNames":[{}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"SAITOH, Ayumu"}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifier":""}],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"NAKAMURA,  Hiroaki"}],"familyNames":[{}],"givenNames":[{}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2022-07-13"}],"displaytype":"detail","filename":"10538_PFR.pdf","filesize":[{"value":"4.2 MB"}],"format":"application/pdf","licensetype":"license_11","mimetype":"application/pdf","url":{"label":"10538_PFR","url":"https://nifs-repository.repo.nii.ac.jp/record/11449/files/10538_PFR.pdf"},"version_id":"47f2a8ea-0bf1-4e34-a854-de1337335433"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"block LU decomposition","subitem_subject_scheme":"Other"},{"subitem_subject":"critical current density","subitem_subject_scheme":"Other"},{"subitem_subject":"high-temperature superconductor","subitem_subject_scheme":"Other"},{"subitem_subject":"integrodifferential equation","subitem_subject_scheme":"Other"},{"subitem_subject":"surface crack","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"High-Speed Algorithm for Shielding Current Analysis in HTS Film with Cracks","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"High-Speed Algorithm for Shielding Current Analysis in HTS Film with Cracks"}]},"item_type_id":"10001","owner":"20","path":["7"],"pubdate":{"attribute_name":"公開日","attribute_value":"2022-07-13"},"publish_date":"2022-07-13","publish_status":"0","recid":"11449","relation_version_is_last":true,"title":["High-Speed Algorithm for Shielding Current Analysis in HTS Film with Cracks"],"weko_creator_id":"20","weko_shared_id":-1},"updated":"2023-09-29T04:24:42.233199+00:00"}