{"created":"2023-06-20T15:17:33.033063+00:00","id":11459,"links":{},"metadata":{"_buckets":{"deposit":"1a9e2f24-e8d3-481f-84a0-2f631ffd871d"},"_deposit":{"created_by":20,"id":"11459","owners":[20],"pid":{"revision_id":0,"type":"depid","value":"11459"},"status":"published"},"_oai":{"id":"oai:nifs-repository.repo.nii.ac.jp:00011459","sets":["6:7"]},"author_link":["67087","127770","127006","127005"],"item_10001_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2014-07-29","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"Special Issue 2","bibliographicPageStart":"3401129","bibliographicVolumeNumber":"9","bibliographic_titles":[{"bibliographic_title":"Plasma and Fusion Research"}]}]},"item_10001_description_4":{"attribute_name":"著者ID","attribute_value_mlt":[{"subitem_description":"0000-0001-9924-9241","subitem_description_type":"Other"}]},"item_10001_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"The inductive method for measuring the critical current density in a high-temperature superconducting (HTS) film has been reproduced numerically. To this end, a numerical code has been developed for analyzing the time evolution of a shielding current density in an HTS film containing a crack. The of computational results show that the accuracy of the inductive method monotonously increases with the height of the coil. In addition, the accuracy is slightly improved by changing the inner radius of the coil, and there exists the optimum inner radius. Although the accuracy is degraded due to the crack, this result means that the inductive method can be applied to the crack detection. Consequently, the crack located near the film edge cannot be detected with high accuracy because the crack is treated the same as the film edge. ","subitem_description_type":"Abstract"}]},"item_10001_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"The Japan Society of Plasma Science and Nuclear Fusion Research "}]},"item_10001_relation_14":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"10.1585/pfr.9.3401129 ","subitem_relation_type_select":"DOI"}}]},"item_10001_relation_17":{"attribute_name":"関連サイト","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"Publisher version"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1585/pfr.9.3401129","subitem_relation_type_select":"DOI"}}]},"item_10001_rights_15":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"(c) 2014 The Japan Society of Plasma Science and Nuclear Fusion Research "}]},"item_10001_source_id_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA12346675","subitem_source_identifier_type":"NCID"}]},"item_10001_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1880-6821","subitem_source_identifier_type":"ISSN"}]},"item_10001_text_23":{"attribute_name":"NAIS","attribute_value_mlt":[{"subitem_text_value":"10528"}]},"item_10001_text_25":{"attribute_name":"書誌的事項","attribute_value_mlt":[{"subitem_text_value":"the 23rd International Toki Conference on Large-scale Simulation and Fusion Science"}]},"item_10001_version_type_20":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifier":""}],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"TAKAYAMA, Teruou"}],"familyNames":[{}],"givenNames":[{}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifier":""}],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"KAMITANI, Atsushi"}],"familyNames":[{}],"givenNames":[{}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"IKUNO, Soichiro"}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifier":""}],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"NAKAMURA,  Hiroaki"}],"familyNames":[{}],"givenNames":[{}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2022-07-13"}],"displaytype":"detail","filename":"10528_PFR.pdf","filesize":[{"value":"1.2 MB"}],"format":"application/pdf","licensetype":"license_11","mimetype":"application/pdf","url":{"label":"10528_PFR","url":"https://nifs-repository.repo.nii.ac.jp/record/11459/files/10528_PFR.pdf"},"version_id":"e4df5812-ebdd-4214-aa71-dfe33d4bf730"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"critical current density","subitem_subject_scheme":"Other"},{"subitem_subject":"crack detection","subitem_subject_scheme":"Other"},{"subitem_subject":"high-temperature superconductor","subitem_subject_scheme":"Other"},{"subitem_subject":"inductive method","subitem_subject_scheme":"Other"},{"subitem_subject":"numerical simulation","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Numerical Simulation of Contactless Methods for Measuring jC in High-Temperature Superconducting Film: Influence of Defect on Resolution and Accuracy","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Numerical Simulation of Contactless Methods for Measuring jC in High-Temperature Superconducting Film: Influence of Defect on Resolution and Accuracy"}]},"item_type_id":"10001","owner":"20","path":["7"],"pubdate":{"attribute_name":"公開日","attribute_value":"2022-07-13"},"publish_date":"2022-07-13","publish_status":"0","recid":"11459","relation_version_is_last":true,"title":["Numerical Simulation of Contactless Methods for Measuring jC in High-Temperature Superconducting Film: Influence of Defect on Resolution and Accuracy"],"weko_creator_id":"20","weko_shared_id":-1},"updated":"2023-09-29T04:24:41.886751+00:00"}