{"created":"2023-06-20T15:17:41.863528+00:00","id":11623,"links":{},"metadata":{"_buckets":{"deposit":"bb65f6dc-24a0-4d52-9c46-94589827f2b4"},"_deposit":{"created_by":20,"id":"11623","owners":[20],"pid":{"revision_id":0,"type":"depid","value":"11623"},"status":"published"},"_oai":{"id":"oai:nifs-repository.repo.nii.ac.jp:00011623","sets":["6:7"]},"author_link":["66532","66269","128009","126542","66541","66893"],"item_10001_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2022-09-21","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"9","bibliographicPageStart":"093513","bibliographicVolumeNumber":"93","bibliographic_titles":[{"bibliographic_title":"Review of Scientific Instruments "}]}]},"item_10001_description_4":{"attribute_name":"著者ID","attribute_value_mlt":[{"subitem_description":"0000-0002-0990-7093","subitem_description_type":"Other"}]},"item_10001_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"A gas puff imaging system has been developed to measure edge fluctuations in large helical device. The optical system splits the image of the plasma into four wavelengths, Hα/Dα (656 nm), HeI (1s2p–1s3d; 587.6; 1s2p–1s3d, 667.8; and 1s2p–1s3s, 706.5 nm), enabling simultaneous measurement of the spatial distribution of line ratios of He I. The image of the plasma is amplified with an image intensifier and recorded with a fast-framing camera. The measurement area has a diameter of 20 cm just outside of the last closed flux surface. The spatial resolution of the optical system is about 3 mm, and the frame rate is 100 kHz for acquisition of the four wavelength images. Signal-to-noise ratio is evaluated for the system, and further improvement is discussed. Clear images are obtained for all wavelengths and a slightly different pattern is recognized, depending on the wavelength. A singular value decomposition analysis can decompose the image clearly to one perpendicular and parallel to the magnetic field lines.","subitem_description_type":"Abstract"}]},"item_10001_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"AIP Publishing "}]},"item_10001_relation_14":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":" https://doi.org/10.1063/5.0100301","subitem_relation_type_select":"DOI"}}]},"item_10001_relation_16":{"attribute_name":"情報源","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"Review of Scientific Instruments 93, 093513 (2022); https://doi.org/10.1063/5.0100301"}]}]},"item_10001_relation_17":{"attribute_name":"関連サイト","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"Publisher version"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":" https://doi.org/10.1063/5.0100301","subitem_relation_type_select":"DOI"}}]},"item_10001_rights_15":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"© 2022 Author(s)."},{"subitem_rights":" All article content, except where otherwise noted, is licensed under a Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/). "},{"subitem_rights":"This article may be downloaded for personal use only. "},{"subitem_rights":"Any other use requires prior permission of the author and AIP Publishing. "}]},"item_10001_source_id_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA00817730 ","subitem_source_identifier_type":"NCID"}]},"item_10001_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0034-6748 ","subitem_source_identifier_type":"ISSN"}]},"item_10001_text_23":{"attribute_name":"NAIS","attribute_value_mlt":[{"subitem_text_value":"13390"}]},"item_10001_version_type_20":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifier":""}],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"KOBAYASHI,  Masahiro"}],"familyNames":[{}],"givenNames":[{}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifier":""}],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"OHDACHI,  Satoshi"}],"familyNames":[{}],"givenNames":[{}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifier":""}],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"XU,  Yuhong"}],"familyNames":[{}],"givenNames":[{}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"LI, W."}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifier":""}],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"SHIMIZU,  Akihiro"}],"familyNames":[{}],"givenNames":[{}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifier":""}],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"CHENG, Jun"}],"familyNames":[{}],"givenNames":[{}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2023-09-21"}],"displaytype":"detail","filename":"13390_Rev.Sci.Instr.pdf","filesize":[{"value":"7.4 MB"}],"format":"application/pdf","licensetype":"license_6","mimetype":"application/pdf","url":{"label":"13390_Rev.Sci.Instr","url":"https://nifs-repository.repo.nii.ac.jp/record/11623/files/13390_Rev.Sci.Instr.pdf"},"version_id":"433e280e-496c-459b-a0e4-61a5b18b13d5"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Gas puff imaging system for edge plasma fluctuation measurements in large helical device","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Gas puff imaging system for edge plasma fluctuation measurements in large helical device"}]},"item_type_id":"10001","owner":"20","path":["7"],"pubdate":{"attribute_name":"公開日","attribute_value":"2023-01-24"},"publish_date":"2023-01-24","publish_status":"0","recid":"11623","relation_version_is_last":true,"title":["Gas puff imaging system for edge plasma fluctuation measurements in large helical device"],"weko_creator_id":"20","weko_shared_id":-1},"updated":"2024-02-19T01:52:30.211219+00:00"}