{"created":"2023-06-20T15:17:42.151731+00:00","id":11629,"links":{},"metadata":{"_buckets":{"deposit":"0ad6a92f-0e82-4176-9f35-fb4d0930baa0"},"_deposit":{"created_by":20,"id":"11629","owners":[20],"pid":{"revision_id":0,"type":"depid","value":"11629"},"status":"published"},"_oai":{"id":"oai:nifs-repository.repo.nii.ac.jp:00011629","sets":["6:7"]},"author_link":["128015","67436","128018","128020","127587","128019","127812","128021","126352","128017","66533","128022","128016"],"item_10001_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2018-10-19","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"10","bibliographicPageStart":"10I144","bibliographicVolumeNumber":"89","bibliographic_titles":[{"bibliographic_title":"Review of Scientific Instruments "}]}]},"item_10001_description_4":{"attribute_name":"著者ID","attribute_value_mlt":[{"subitem_description":"0000-0003-4624-4679","subitem_description_type":"Other"}]},"item_10001_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"The scintillator-based detector for fast-ion loss measurements has been installed on EAST. To obtain high temporal resolution for fast-ion loss diagnostics, fast photomultiplier tube systems have been developed which can supply the complementary measurements to the previous image system with good energy and pitch resolution by using a CCD camera. By applying the rotatable platform, the prompt losses of beam-ions can be measured in normal and reverse magnetic field. The thick-target bremsstrahlung occurring in the stainless steel shield with energetic electrons can produce X-rays, which will strike on the scintillator based detector. To understand this interference on fast-ion loss signals, the effects of energetic electrons on the scintillator-based detector are studied, including runaway electrons in the plasma ramping-up phase and fast electrons accelerated by the lower hybrid wave.","subitem_description_type":"Abstract"}]},"item_10001_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"AIP Publishing "}]},"item_10001_relation_14":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"10.1063/1.5038782","subitem_relation_type_select":"DOI"}}]},"item_10001_relation_16":{"attribute_name":"情報源","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"Review of Scientific Instruments 89, 10I144 (2018); https://doi.org/10.1063/1.5038782"}]}]},"item_10001_relation_17":{"attribute_name":"関連サイト","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"Publisher version"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":" https://doi.org/10.1063/1.5038782","subitem_relation_type_select":"DOI"}}]},"item_10001_rights_15":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"© 2018 Author(s). "},{"subitem_rights":"This article may be downloaded for personal use only. "},{"subitem_rights":"Any other use requires prior permission of the author and AIP Publishing. "}]},"item_10001_source_id_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA00817730 ","subitem_source_identifier_type":"NCID"}]},"item_10001_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0034-6748 ","subitem_source_identifier_type":"ISSN"}]},"item_10001_text_23":{"attribute_name":"NAIS","attribute_value_mlt":[{"subitem_text_value":"13614"}]},"item_10001_version_type_20":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"WU, ChengRui"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"HUANG, J."}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"CHANG, Jiafeng"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"ZHANG, J."}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"ZHOU, Ruijie"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"XU, Z."}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"GAO, W."}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifier":""}],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"ISOBE,  Mitsutaka"}],"familyNames":[{}],"givenNames":[{}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifier":""}],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"OGAWA,  Kunihiro"}],"familyNames":[{}],"givenNames":[{}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"LIN, S. Y."}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"HU, Liqun"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"LI, J. G."}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"EAST Team"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2023-02-06"}],"displaytype":"detail","filename":"13614_Rev.Sci.Instr.pdf","filesize":[{"value":"2.3 MB"}],"format":"application/pdf","licensetype":"license_6","mimetype":"application/pdf","url":{"label":"13614_Rev.Sci.Instr","url":"https://nifs-repository.repo.nii.ac.jp/record/11629/files/13614_Rev.Sci.Instr.pdf"},"version_id":"df4155c8-a25b-4cb6-9579-71e1de2c6aa7"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Performance of fast-ion loss diagnostic on EAST","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Performance of fast-ion loss diagnostic on EAST"}]},"item_type_id":"10001","owner":"20","path":["7"],"pubdate":{"attribute_name":"公開日","attribute_value":"2023-02-06"},"publish_date":"2023-02-06","publish_status":"0","recid":"11629","relation_version_is_last":true,"title":["Performance of fast-ion loss diagnostic on EAST"],"weko_creator_id":"20","weko_shared_id":-1},"updated":"2023-07-31T03:01:15.903157+00:00"}