@article{oai:nifs-repository.repo.nii.ac.jp:00000202,
 author = {SUZUKI,  Chihiro and AKIYAMA,  Tsuyoshi and FUJISAWA,  Akihide and IDA,  Katsumi and ISOBE,  Mitsutaka and MATSUOKA,  Keisuke and MINAMI,  Takashi and NAGAOKA,  Kenichi and NISHIMURA,  Shin and OKAMURA,  Shoichi and PETERSON,  Byron J. and SHIMIZU,  Akihiro and TAKAHASHI,  Chihiro and TOI,  Kazuo and YOSHIMURA,  Yasuo},
 journal = {Plasma and Fusion Research},
 month = {Jan},
 note = {Radiation brightness and impurity behaviors have been studied for reheat mode discharges in the Compact Helical System (CHS) by three different types of impurity diagnostics. Total radiation power measured by a pyroelectric detector significantly reduces after entering the reheat mode, whereas the line-averaged radiation brightness measured by an absolute extreme ultraviolet (AXUV) photodiode array increases especially for a center viewing chord due to the impurity accumulation in the plasma core. One possible reason for this opposite behavior between the two bolometric detectors is the reduced sensitivity of the AXUV photodiode for lower energy photons in vacuum ultraviolet (VUV) region. This speculation is supported by temporal evolutions of VUV spectra measured by a grazing incidence spectrometer. These results demonstrate that the comparison of three impurity diagnostics would be beneficial to the determination of the major impurity radiators and a comprehensive understanding of impurity behaviors in the reheat mode discharges.},
 title = {Determination of the Major Impurity Radiators in the Reheat Mode Discharges in the Compact Helical System},
 volume = {Vol.2},
 year = {2007}
}