{"created":"2023-06-20T15:07:59.918902+00:00","id":234,"links":{},"metadata":{"_buckets":{"deposit":"cba2f372-8914-422d-ba25-9691a6aca244"},"_deposit":{"created_by":3,"id":"234","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"234"},"status":"published"},"_oai":{"id":"oai:nifs-repository.repo.nii.ac.jp:00000234","sets":["6:7"]},"author_link":["67777"],"item_2_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2013-08-01","bibliographicIssueDateType":"Issued"},"bibliographicPageStart":"1202110-1-1202110-2","bibliographicVolumeNumber":"Vol.8","bibliographic_titles":[{},{"bibliographic_title":"Plasma and Fusion Research","bibliographic_titleLang":"en"}]}]},"item_2_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"A simple new tool for deposition layer studies, a directional material probe, is proposed. The probe, which examines the directionality of deposition layer formation, consists of a flat disk and pin. If deposits have directionality, a shadow of the pin is formed on the deposition layer on the disk. If no shadow appears on the deposition layer, this suggests that the deposition layer was formed isotropically. The probe can be applied to plasma-wall interaction studies in fusion devices and laboratory plasma devices such as linear divertor simulators to reveal the material migration mechanisms in such devices. The directional material probe method has been applied to plasma-wall interaction studies in the Large Helical Device (LHD), and a position-dependent variation in the directionality of deposition layer formation was found.","subitem_description_type":"Abstract"}]},"item_2_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"プラズマ・核融合学会"}]},"item_2_relation_14":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"10.1585/pfr.8.1202110","subitem_relation_type_select":"DOI"}}]},"item_2_rights_15":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"? 2013 The Japan Society of Plasma Science and Nuclear Fusion Research"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"MASUZAKI, Suguru","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"67777","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2016-03-11"}],"displaytype":"detail","filename":"pfr2013_08-1202110.pdf","filesize":[{"value":"4.9 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"pfr2013_08-1202110.pdf","url":"https://nifs-repository.repo.nii.ac.jp/record/234/files/pfr2013_08-1202110.pdf"},"version_id":"ff63fd05-1b64-4c19-8ed6-6f5613e8418c"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"directional material probe","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"deposition layer","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"directionality","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"plasma-wall interaction","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"material migration","subitem_subject_language":"en","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Directional Material Probe for Deposition Layer Studies","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Directional Material Probe for Deposition Layer Studies","subitem_title_language":"en"}]},"item_type_id":"2","owner":"3","path":["7"],"pubdate":{"attribute_name":"公開日","attribute_value":"2013-11-18"},"publish_date":"2013-11-18","publish_status":"0","recid":"234","relation_version_is_last":true,"title":["Directional Material Probe for Deposition Layer Studies"],"weko_creator_id":"3","weko_shared_id":-1},"updated":"2023-06-20T20:47:16.574144+00:00"}