{"created":"2023-06-20T15:08:03.853198+00:00","id":305,"links":{},"metadata":{"_buckets":{"deposit":"f53885bf-ec72-47c2-8fea-2a9dffb6ba1f"},"_deposit":{"created_by":3,"id":"305","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"305"},"status":"published"},"_oai":{"id":"oai:nifs-repository.repo.nii.ac.jp:00000305","sets":["6:7"]},"author_link":["122717","122715","122716","122718","122719","122720"],"item_2_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2014-06-01","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"S2","bibliographicPageStart":"3402097-1-4","bibliographicVolumeNumber":"Vol.9","bibliographic_titles":[{},{"bibliographic_title":"Plasma and Fusion Research","bibliographic_titleLang":"en"}]}]},"item_2_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"In this study, using a scintillator-based lost fast-ion probe, we have measured fast-ion losses in the Large Helical Device, in which the losses were caused by externally applied static magnetic perturbations (MPs) having small amplitudes. Energy and pitch-angle resolved measurements reveal that the effects of MPs on fast-ion losses occur in both high and low pitch-angle regions. A Lorentz orbit-following calculation indicates that static MPs can change the orbits of fast ions, which can enhance the transport/loss of fast ions.","subitem_description_type":"Abstract"}]},"item_2_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"プラズマ・核融合学会"}]},"item_2_relation_14":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"10.1585/pfr.9.3402097","subitem_relation_type_select":"DOI"}}]},"item_2_rights_15":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"? 2014 The Japan Society of Plasma Science and Nuclear Fusion Research"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"OGAWA,  Kunihiro","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"ISOBE,  Mitsutaka","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"TOI,  Kazuo","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"SHIMIZU,  Akihiro","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"OSAKABE,  Masaki","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"LHD, Experiment Group1","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2016-03-23"}],"displaytype":"detail","filename":"pfr2014_09-3402097.pdf","filesize":[{"value":"1.2 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"pfr2014_09-3402097.pdf","url":"https://nifs-repository.repo.nii.ac.jp/record/305/files/pfr2014_09-3402097.pdf"},"version_id":"b6aeb629-d188-4f02-9096-0885efe096ee"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"fast ion","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"Large Helical Device","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"lost-fast ion probe","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"static magnetic perturbation","subitem_subject_language":"en","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Fast-Ion Losses due to Externally Applied Static Magnetic Perturbations in the Large Helical Device","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Fast-Ion Losses due to Externally Applied Static Magnetic Perturbations in the Large Helical Device","subitem_title_language":"en"}]},"item_type_id":"2","owner":"3","path":["7"],"pubdate":{"attribute_name":"公開日","attribute_value":"2015-04-17"},"publish_date":"2015-04-17","publish_status":"0","recid":"305","relation_version_is_last":true,"title":["Fast-Ion Losses due to Externally Applied Static Magnetic Perturbations in the Large Helical Device"],"weko_creator_id":"3","weko_shared_id":-1},"updated":"2023-06-20T16:44:16.857582+00:00"}