{"created":"2023-06-20T15:08:07.914818+00:00","id":400,"links":{},"metadata":{"_buckets":{"deposit":"c908beea-7966-423c-9fb6-ca1fa1121bab"},"_deposit":{"created_by":3,"id":"400","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"400"},"status":"published"},"_oai":{"id":"oai:nifs-repository.repo.nii.ac.jp:00000400","sets":["6:7"]},"author_link":["123779","123789","123777","123781","123785","123783","123784","123788","123782","123778","123780","123787","123786","123790"],"item_2_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2008-01-01","bibliographicIssueDateType":"Issued"},"bibliographicPageStart":"pp.10F318-1 - 10F318-4","bibliographicVolumeNumber":"Vol.79","bibliographic_titles":[{},{"bibliographic_title":"Review of Scientific Instruments","bibliographic_titleLang":"en"}]}]},"item_2_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"Heavy ion beam probe (HIBP) for large helical device (LHD) has been improved to measure the potential fluctuation in high-temperature plasmas. The spatial resolution is improved to about 10 mm by controlling the focus of a probe beam. The HIBP is applied to measure the potential fluctuation in plasmas where the rotational transform is controlled by electron cyclotron current drive. The fluctuations whose frequencies change with the time constant of a few hundreds of milliseconds and that with a constant frequency are observed. The characteristics of the latter fluctuation are similar to those of the geodesic acoustic mode oscillation. The spatial profiles of the fluctuations are also obtained.","subitem_description_type":"Abstract"}]},"item_2_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"American Institute of Physics"}]},"item_2_relation_14":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"10.1063/1.2971207","subitem_relation_type_select":"DOI"}}]},"item_2_relation_17":{"attribute_name":"関連サイト","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"Publisher version"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1063/1.2971207","subitem_relation_type_select":"DOI"}}]},"item_2_rights_15":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"? 2008 American Institute of Physics"}]},"item_2_version_type_20":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Ido,  Takeshi","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Shimizu,  Akihiro","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Nishiura,  Masaki","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Nakano,  Haruhisa","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Ohshima,  Shinsuke","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Kato,  Shinji","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Hamada,  Yasuji","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Yoshimura,  Yasuo","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Kubo,  Shin","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Shimozuma,  Takashi","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Igami,  Hiroe","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Takahashi,  Hiromi","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Toi,  Kazuo","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Watanabe,  Fumitake","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2016-03-23"}],"displaytype":"detail","filename":"1946.pdf","filesize":[{"value":"603.7 kB"}],"format":"application/pdf","licensetype":"license_11","mimetype":"application/pdf","url":{"label":"1946.pdf","url":"https://nifs-repository.repo.nii.ac.jp/record/400/files/1946.pdf"},"version_id":"6ca3ca51-6078-44bc-9e2a-059125bd8999"},{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2022-03-17"}],"displaytype":"detail","filename":"VoR_Rev.Sci.Instr79_10F318.pdf","filesize":[{"value":"1.1 MB"}],"format":"application/pdf","licensetype":"license_11","mimetype":"application/pdf","url":{"label":"VoR_Rev.Sci.Instr79_10F318","url":"https://nifs-repository.repo.nii.ac.jp/record/400/files/VoR_Rev.Sci.Instr79_10F318.pdf"},"version_id":"79e473e0-e3eb-4c40-aca4-226fa8cb340d"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"plasma diagnostics","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"plasma temperature","subitem_subject_language":"en","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Measurement of electrostatic potential fluctuation using heavy ion beam probe in large helical device","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Measurement of electrostatic potential fluctuation using heavy ion beam probe in large helical device"}]},"item_type_id":"2","owner":"3","path":["7"],"pubdate":{"attribute_name":"公開日","attribute_value":"2010-03-09"},"publish_date":"2010-03-09","publish_status":"0","recid":"400","relation_version_is_last":true,"title":["Measurement of electrostatic potential fluctuation using heavy ion beam probe in large helical device"],"weko_creator_id":"3","weko_shared_id":3},"updated":"2023-06-20T16:20:46.514349+00:00"}