{"created":"2023-06-20T15:08:08.820334+00:00","id":423,"links":{},"metadata":{"_buckets":{"deposit":"83592df8-1a07-4fd9-acb8-df2da2897d47"},"_deposit":{"created_by":3,"id":"423","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"423"},"status":"published"},"_oai":{"id":"oai:nifs-repository.repo.nii.ac.jp:00000423","sets":["6:7"]},"author_link":["123917","123916","123915"],"item_2_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2010-01-01","bibliographicIssueDateType":"Issued"},"bibliographicPageStart":"10D906-1 - 10D906-4","bibliographicVolumeNumber":"Vol.81","bibliographic_titles":[{},{"bibliographic_title":"Review of Scientific Instruments","bibliographic_titleLang":"en"}]}]},"item_2_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"In order to measure the internal structure of density fluctuations using a microwave reflectometer, the broadband frequency tunable system, which has the ability of fast and stable hopping operation, has been improved in the Large Helical Device. Simultaneous multipoint measurement is the key issue of this development. For accurate phase measurement, the system utilizes a single sideband modulation technique. Currently, a dual channel heterodyne frequency hopping reflectometer system has been constructed and applied to the Alfv?n eigenmode measurements.","subitem_description_type":"Abstract"}]},"item_2_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"American Institute of Physics"}]},"item_2_relation_14":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"10.1063/1.3478747","subitem_relation_type_select":"DOI"}}]},"item_2_relation_17":{"attribute_name":"関連サイト","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"Publisher version"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1063/1.3478747","subitem_relation_type_select":"DOI"}}]},"item_2_rights_15":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"? 2010 American Institute of Physics"}]},"item_2_version_type_20":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Tokuzawa,  T.","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Ejiri,  A.","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Kawahata,  K.","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2016-03-23"}],"displaytype":"detail","filename":"RevSciInstrum_81_10D906.pdf","filesize":[{"value":"1.0 MB"}],"format":"application/pdf","licensetype":"license_11","mimetype":"application/pdf","url":{"label":"RevSciInstrum_81_10D906.pdf","url":"https://nifs-repository.repo.nii.ac.jp/record/423/files/RevSciInstrum_81_10D906.pdf"},"version_id":"0f7e0161-0444-4e7b-b514-f6905044c20e"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"plasma Alfven waves","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"plasma density","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"plasma diagnostics","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"plasma fluctuations","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"plasma toroidal confinement","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"stellarators","subitem_subject_language":"en","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Multifrequency channel microwave reflectometer with frequency hopping operation for density fluctuation measurements in Large Helical Device","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Multifrequency channel microwave reflectometer with frequency hopping operation for density fluctuation measurements in Large Helical Device","subitem_title_language":"en"}]},"item_type_id":"2","owner":"3","path":["7"],"pubdate":{"attribute_name":"公開日","attribute_value":"2012-02-03"},"publish_date":"2012-02-03","publish_status":"0","recid":"423","relation_version_is_last":true,"title":["Multifrequency channel microwave reflectometer with frequency hopping operation for density fluctuation measurements in Large Helical Device"],"weko_creator_id":"3","weko_shared_id":3},"updated":"2023-06-20T16:20:58.519955+00:00"}