{"created":"2023-06-20T15:08:20.787912+00:00","id":662,"links":{},"metadata":{"_buckets":{"deposit":"8f998d90-f366-4ef0-8a41-0aaf4d883049"},"_deposit":{"created_by":3,"id":"662","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"662"},"status":"published"},"_oai":{"id":"oai:nifs-repository.repo.nii.ac.jp:00000662","sets":["6:7"]},"author_link":["126099","126100","126097","126096","126098"],"item_2_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2008-10-01","bibliographicIssueDateType":"Issued"},"bibliographicPageStart":"10F109-1 - 10F109-4","bibliographicVolumeNumber":"Vol.79","bibliographic_titles":[{},{"bibliographic_title":"Review of Scientific Instruments","bibliographic_titleLang":"en"}]}]},"item_2_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"In order to measure the internal structure of fluctuation, the broadband frequency tunable system, which has the ability of fast and stable hopping operation, is applied in the Large Helical Device. One of the important issues of density fluctuation measurements using this reflectometer is the study of energetic particle driven magnetohydrodynamics instability. During one plasma discharge, the launching frequency changes from one frequency to another frequency, which this operation is called as frequency hopping, and the cutoff position can be scanned in the wide area. As a hopping source, a synthesizer is used because it has a quite stable and low phase noise. The frequency component of the source output is multiplied to V-band (50?75 GHz) region for plasma measurements in extraordinary mode polarization. Also this system has a heterodyne detection with single side band frequency modulation for sensitive phase and amplitude measurement. We can obtain the radial profile of Alfv?n eigenmodelike oscillation in a neutral beam injected plasma.","subitem_description_type":"Abstract"}]},"item_2_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"American Institute of Physics"}]},"item_2_relation_14":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"10.1063/1.2969036","subitem_relation_type_select":"DOI"}}]},"item_2_relation_17":{"attribute_name":"関連サイト","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"Publisher version"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1063/1.2969036","subitem_relation_type_select":"DOI"}}]},"item_2_rights_15":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"? 2008 American Institute of Physics"}]},"item_2_version_type_20":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Tokuzawa,  T.","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Ejiri,  A.","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Kawahata,  K.","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Tanaka,  K.","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Ito,  Y.","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2016-03-23"}],"displaytype":"detail","filename":"1938 RevSciInstrum_79_10F109.pdf","filesize":[{"value":"533.1 kB"}],"format":"application/pdf","licensetype":"license_11","mimetype":"application/pdf","url":{"label":"1938 RevSciInstrum_79_10F109.pdf","url":"https://nifs-repository.repo.nii.ac.jp/record/662/files/1938 RevSciInstrum_79_10F109.pdf"},"version_id":"034cb849-b9db-40dc-8168-0f739577b656"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"discharges (electric)","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"microwave reflectometry","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"plasma diagnostics","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"plasma fluctuations","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"plasma instability","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"plasma magnetohydrodynamics","subitem_subject_language":"en","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"V-band frequency hopping microwave reflectometer in LHD","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"V-band frequency hopping microwave reflectometer in LHD"}]},"item_type_id":"2","owner":"3","path":["7"],"pubdate":{"attribute_name":"公開日","attribute_value":"2010-10-08"},"publish_date":"2010-10-08","publish_status":"0","recid":"662","relation_version_is_last":true,"title":["V-band frequency hopping microwave reflectometer in LHD"],"weko_creator_id":"3","weko_shared_id":3},"updated":"2023-06-20T16:21:54.053196+00:00"}