{"created":"2023-06-20T15:15:56.469160+00:00","id":9588,"links":{},"metadata":{"_buckets":{"deposit":"086d3737-e101-4932-b179-794579f081c5"},"_deposit":{"created_by":3,"id":"9588","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"9588"},"status":"published"},"_oai":{"id":"oai:nifs-repository.repo.nii.ac.jp:00009588","sets":["8:32"]},"author_link":["58043","58040","58041","58042","58039"],"item_5_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"1996-11-01","bibliographicIssueDateType":"Issued"},"bibliographic_titles":[{},{"bibliographic_title":"Research Report NIFS-Series","bibliographic_titleLang":"en"}]}]},"item_5_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"\"By a new modification of a parallel plate analyzer the second order focus is obtained in an arbitrary injection angle. This kind of an analyzer with a small injection angle will have an advantage of small operational voltage, compared to the Proca and Green analyzer where the injection angle is 30 degrees.  Thus, the newly proposed analyzer will be very useful for the precise energy measurement of high energy particles in MeV range.\"","subitem_description_type":"Abstract"}]},"item_5_source_id_10":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0915-633X","subitem_source_identifier_type":"ISSN"}]},"item_5_text_8":{"attribute_name":"報告書番号","attribute_value_mlt":[{"subitem_text_value":"NIFS-460"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"\"Hamada,  Y.","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Fujisawa,  A.","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Iguchi,  H.","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Nishizawa,  A.","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Kawasumi,  Y.\"","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"analyzer","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"parallel plate analyzer","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"beam","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"HIBP","subitem_subject_language":"en","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"research report","resourceuri":"http://purl.org/coar/resource_type/c_18ws"}]},"item_title":"A Tandem Parallel Plate Analyzer","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"A Tandem Parallel Plate Analyzer","subitem_title_language":"en"}]},"item_type_id":"5","owner":"3","path":["32"],"pubdate":{"attribute_name":"公開日","attribute_value":"2010-02-05"},"publish_date":"2010-02-05","publish_status":"0","recid":"9588","relation_version_is_last":true,"title":["A Tandem Parallel Plate Analyzer"],"weko_creator_id":"3","weko_shared_id":-1},"updated":"2023-06-20T20:57:45.776910+00:00"}