{"created":"2023-06-20T15:15:56.516128+00:00","id":9589,"links":{},"metadata":{"_buckets":{"deposit":"47e3bc4d-65ef-470e-b909-908b83fed28d"},"_deposit":{"created_by":3,"id":"9589","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"9589"},"status":"published"},"_oai":{"id":"oai:nifs-repository.repo.nii.ac.jp:00009589","sets":["8:32"]},"author_link":["58046","58048","58047","58045","58049","58044"],"item_5_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"1992-12-01","bibliographicIssueDateType":"Issued"},"bibliographic_titles":[{},{"bibliographic_title":"Research Report NIFS-Series","bibliographic_titleLang":"en"}]}]},"item_5_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"\"The effect of field irregularity due to meshes on the holes of a lower electrode in a parallel-plate electrostatic analyzer for beam penetration, is experimentally and numerically investigated.  Displacement of a focal point and degradation of analyzer characteristics are found in the experiment.  They are also confirmed by numerical analysis.  Criteria for the error estimation are theoretically derived and found to be consistent with the experiment\"","subitem_description_type":"Abstract"}]},"item_5_source_id_10":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0915-633X","subitem_source_identifier_type":"ISSN"}]},"item_5_text_8":{"attribute_name":"報告書番号","attribute_value_mlt":[{"subitem_text_value":"NIFS-203"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"\"Hamada,  Y.","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Kawasumi,  Y.","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Iguchi,  H.","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Fujisawa,  A.","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Abe,  Y.","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Takahashi,  M.\"","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"analyzer","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"mesh","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"deflection","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"HIBP","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"focus","subitem_subject_language":"en","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"research report","resourceuri":"http://purl.org/coar/resource_type/c_18ws"}]},"item_title":"Mesh Effect in a Parallel Plate Analyzer","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Mesh Effect in a Parallel Plate Analyzer","subitem_title_language":"en"}]},"item_type_id":"5","owner":"3","path":["32"],"pubdate":{"attribute_name":"公開日","attribute_value":"2010-02-05"},"publish_date":"2010-02-05","publish_status":"0","recid":"9589","relation_version_is_last":true,"title":["Mesh Effect in a Parallel Plate Analyzer"],"weko_creator_id":"3","weko_shared_id":-1},"updated":"2023-06-20T20:57:45.116309+00:00"}