{"created":"2023-06-20T15:16:10.309743+00:00","id":9857,"links":{},"metadata":{"_buckets":{"deposit":"29007ae6-fca3-4917-807a-fe4115710c97"},"_deposit":{"created_by":3,"id":"9857","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"9857"},"status":"published"},"_oai":{"id":"oai:nifs-repository.repo.nii.ac.jp:00009857","sets":["8:32"]},"author_link":["60119","60121","60118","60120","60122"],"item_5_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"1990-02-01","bibliographicIssueDateType":"Issued"},"bibliographic_titles":[{},{"bibliographic_title":"Research Report NIFS-Series","bibliographic_titleLang":"en"}]}]},"item_5_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"A high temperature radiation source has been developed for the absolute calibration of diagnostic instruments for measuring electron cyclotron emission from high temperature plasmas. The source has a radiation area of phi150 mm and can be heated up to 500 degrees C. The measured emissivity of the source is close to unity in the wavelength region between 0.5 and 5 mm . The grating polychromator has been calibrated using the radiation source developed. The obtained temperatures agree with those by the pulse height analysis of soft X-rays and Thomson scattering measurement within 10 %.","subitem_description_type":"Abstract"}]},"item_5_source_id_10":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0915-633X","subitem_source_identifier_type":"ISSN"}]},"item_5_text_8":{"attribute_name":"報告書番号","attribute_value_mlt":[{"subitem_text_value":"NIFS-019"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"\"Kawahata, K.","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Sakamoto, M.","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Fujita, J.","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Matsuo, H.","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Sakai, K.\"","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"calibration source","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"electron cyclotron emission","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"grating polychromator","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"electron temperature","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"tokamak plasma","subitem_subject_language":"en","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"research report","resourceuri":"http://purl.org/coar/resource_type/c_18ws"}]},"item_title":"Calibration Source for Electron Cyclotron Emission Measurements","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Calibration Source for Electron Cyclotron Emission Measurements","subitem_title_language":"en"}]},"item_type_id":"5","owner":"3","path":["32"],"pubdate":{"attribute_name":"公開日","attribute_value":"2010-02-05"},"publish_date":"2010-02-05","publish_status":"0","recid":"9857","relation_version_is_last":true,"title":["Calibration Source for Electron Cyclotron Emission Measurements"],"weko_creator_id":"3","weko_shared_id":-1},"updated":"2023-06-20T20:56:10.408290+00:00"}