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{"_buckets": {"deposit": "47e3bc4d-65ef-470e-b909-908b83fed28d"}, "_deposit": {"created_by": 3, "id": "9589", "owners": [3], "pid": {"revision_id": 0, "type": "depid", "value": "9589"}, "status": "published"}, "_oai": {"id": "oai:nifs-repository.repo.nii.ac.jp:00009589", "sets": ["32"]}, "author_link": ["58046", "58048", "58047", "58045", "58049", "58044"], "item_5_biblio_info_7": {"attribute_name": "書誌情報", "attribute_value_mlt": [{"bibliographicIssueDates": {"bibliographicIssueDate": "1992-12-01", "bibliographicIssueDateType": "Issued"}, "bibliographic_titles": [{}, {"bibliographic_title": "Research Report NIFS-Series", "bibliographic_titleLang": "en"}]}]}, "item_5_description_5": {"attribute_name": "抄録", "attribute_value_mlt": [{"subitem_description": "\"The effect of field irregularity due to meshes on the holes of a lower electrode in a parallel-plate electrostatic analyzer for beam penetration, is experimentally and numerically investigated. Displacement of a focal point and degradation of analyzer characteristics are found in the experiment. They are also confirmed by numerical analysis. Criteria for the error estimation are theoretically derived and found to be consistent with the experiment\"", "subitem_description_type": "Abstract"}]}, "item_5_source_id_10": {"attribute_name": "ISSN", "attribute_value_mlt": [{"subitem_source_identifier": "0915-633X", "subitem_source_identifier_type": "ISSN"}]}, "item_5_text_25": {"attribute_name": "登録情報", "attribute_value_mlt": [{"subitem_text_value": "Made available in DSpace on 2010-02-05T10:15:59Z (GMT). No. of bitstreams: 0\n Previous issue date: 1992-12"}]}, "item_5_text_8": {"attribute_name": "報告書番号", "attribute_value_mlt": [{"subitem_text_value": "NIFS-203"}]}, "item_access_right": {"attribute_name": "アクセス権", "attribute_value_mlt": [{"subitem_access_right": "metadata only access", "subitem_access_right_uri": "http://purl.org/coar/access_right/c_14cb"}]}, "item_creator": {"attribute_name": "著者", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "\"Hamada, Y.", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "58044", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Kawasumi, Y.", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "58045", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Iguchi, H.", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "58046", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Fujisawa, A.", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "58047", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Abe, Y.", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "58048", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Takahashi, M.\"", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "58049", "nameIdentifierScheme": "WEKO"}]}]}, "item_keyword": {"attribute_name": "キーワード", "attribute_value_mlt": [{"subitem_subject": "analyzer", "subitem_subject_language": "en", "subitem_subject_scheme": "Other"}, {"subitem_subject": "mesh", "subitem_subject_language": "en", "subitem_subject_scheme": "Other"}, {"subitem_subject": "deflection", "subitem_subject_language": "en", "subitem_subject_scheme": "Other"}, {"subitem_subject": "HIBP", "subitem_subject_language": "en", "subitem_subject_scheme": "Other"}, {"subitem_subject": "focus", "subitem_subject_language": "en", "subitem_subject_scheme": "Other"}]}, "item_language": {"attribute_name": "言語", "attribute_value_mlt": [{"subitem_language": "eng"}]}, "item_resource_type": {"attribute_name": "資源タイプ", "attribute_value_mlt": [{"resourcetype": "research report", "resourceuri": "http://purl.org/coar/resource_type/c_18ws"}]}, "item_title": "Mesh Effect in a Parallel Plate Analyzer", "item_titles": {"attribute_name": "タイトル", "attribute_value_mlt": [{"subitem_title": "Mesh Effect in a Parallel Plate Analyzer", "subitem_title_language": "en"}]}, "item_type_id": "5", "owner": "3", "path": ["32"], "permalink_uri": "http://hdl.handle.net/10655/2320", "pubdate": {"attribute_name": "公開日", "attribute_value": "2010-02-05"}, "publish_date": "2010-02-05", "publish_status": "0", "recid": "9589", "relation": {}, "relation_version_is_last": true, "title": ["Mesh Effect in a Parallel Plate Analyzer"], "weko_shared_id": -1}
Mesh Effect in a Parallel Plate Analyzer
http://hdl.handle.net/10655/2320
http://hdl.handle.net/10655/2320ffaed0c6-0703-47e7-991e-f9d85f3e849e
Item type | 研究報告書 / Research Paper(1) | |||||
---|---|---|---|---|---|---|
公開日 | 2010-02-05 | |||||
タイトル | ||||||
言語 | en | |||||
タイトル | Mesh Effect in a Parallel Plate Analyzer | |||||
言語 | ||||||
言語 | eng | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | analyzer | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | mesh | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | deflection | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | HIBP | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | focus | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_18ws | |||||
資源タイプ | research report | |||||
アクセス権 | ||||||
アクセス権 | metadata only access | |||||
アクセス権URI | http://purl.org/coar/access_right/c_14cb | |||||
著者 |
"Hamada, Y.
× "Hamada, Y.× Kawasumi, Y.× Iguchi, H.× Fujisawa, A.× Abe, Y.× Takahashi, M." |
|||||
抄録 | ||||||
内容記述タイプ | Abstract | |||||
内容記述 | "The effect of field irregularity due to meshes on the holes of a lower electrode in a parallel-plate electrostatic analyzer for beam penetration, is experimentally and numerically investigated. Displacement of a focal point and degradation of analyzer characteristics are found in the experiment. They are also confirmed by numerical analysis. Criteria for the error estimation are theoretically derived and found to be consistent with the experiment" | |||||
書誌情報 |
en : Research Report NIFS-Series 発行日 1992-12-01 |
|||||
報告書番号 | ||||||
NIFS-203 | ||||||
ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 0915-633X |